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Items Tagged with 's-parameter'
Agilent Technologies Inc. introduced the Agilent N1055A 35/50-GHz (8-ps) time-domain reflectometry and transmission module for the Agilent 86100D DCA-X platform. The module provides fast, accurate impedance and S-parameter measurements on high-speed designs that have up to 16 ports.
OML introduces millimeter wave intermodulation distortion (IMD) measurements to target emerging gigabit applications such as WirelessHD, WiGig, 802.11ad and E-band point-to-point radios. In these applications, the linearity of amplifiers and transceivers can adversely affect bit terror rate, especially those involving higher order modulation.
Aeroflex/Inmet Inc. and Modelithics Inc. have teamed to develop Global™ Models for Aeroflex/ Inmet surface mount attenuators (PCAF and PCAAF series) and high power chip resistors (NPC50-50W and NPC50-100W series). The advanced model features include substrate scaling, pad geometry scaling and part value selectability.
OML announces a direct connect configuration that supports millimeter wave S-parameter measurements using the ZVA series network analyzer from Rohde & Schwarz. This entry-level configuration offers engineers the versatility to connect VxxVNA2 series modules directly to the front panel of a four-port dual-source vector network analyzer.
Jon Martens of Anritsu and Al Neves of Wild River Technology used DesignCon 2012 to discuss high-confidence S-parameter measurement methodologies for 15 - 28 Gbpsec.