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Items Tagged with 's-parameter'

ARTICLES

Modelithics passes 10,000 mark with release of the Modelithics COMPLETE Library Version 11

April 11, 2014

Modelithics Inc., the industry leader in simulation models for RF, microwave, and millimeter-wave devices, announces the release of The Modelithics COMPLETE Library V11 for Agilent Advanced Design System (ADS). The Modelithics COMPLETE Library offers the industry’s most comprehensive collection of advanced and highly scalable simulation models for passive components and non-linear models for active devices such as diodes, transistors, amplifiers and more. They are engineered to provide extensive design flexibility and reliably accurate design simulation results. 


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Agilent introduces TDR/TDT solution for accurately characterizing multiport 25/28/100-Gb/s designs

January 29, 2014

Agilent Technologies Inc. introduced the Agilent N1055A 35/50-GHz (8-ps) time-domain reflectometry and transmission module for the Agilent 86100D DCA-X platform. The module provides fast, accurate impedance and S-parameter measurements on high-speed designs that have up to 16 ports.


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OML expands capabilities to support single connection measurements

August 14, 2013

OML introduces millimeter wave intermodulation distortion (IMD) measurements to target emerging gigabit applications such as WirelessHD, WiGig, 802.11ad and E-band point-to-point radios. In these applications, the linearity of amplifiers and transceivers can adversely affect bit terror rate, especially those involving higher order modulation.


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Aeroflex/Inmet and Modelithics announce new chip attenuator, high-power resistor

February 21, 2013

Aeroflex/Inmet Inc. and Modelithics Inc. have teamed to develop Global™ Models for Aeroflex/ Inmet surface mount attenuators (PCAF and PCAAF series) and high power chip resistors (NPC50-50W and NPC50-100W series). The advanced model features include  substrate scaling, pad geometry scaling and part value selectability.


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OML VNA modules are universally compatible with 20 GHz network analyzers

November 8, 2012

OML announces a direct connect configuration that supports millimeter wave S-parameter measurements using the ZVA series network analyzer from Rohde & Schwarz. This entry-level configuration offers engineers the versatility to connect VxxVNA2 series modules directly to the front panel of a four-port dual-source vector network analyzer.


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Constant Wave introduces de-embedding software for VNAs

February 15, 2012
Constant Wave Inc., a developer and provider of measurement analysis software, announced the release of the latest version of its software for use with vector network analyzers: Spectro™ VNA Pro version 2.3.
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Anritsu and Wild River present S-parameter methods

TestBench
January 30, 2012

Anritsu_VNA Jon Martens of Anritsu and Al Neves of Wild River Technology used DesignCon 2012 to discuss high-confidence S-parameter measurement methodologies for 15 - 28 Gbpsec.


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