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Items Tagged with 's-parameter'

ARTICLES

Aeroflex/Inmet and Modelithics announce new chip attenuator, high-power resistor

February 21, 2013

Aeroflex/Inmet Inc. and Modelithics Inc. have teamed to develop Global™ Models for Aeroflex/ Inmet surface mount attenuators (PCAF and PCAAF series) and high power chip resistors (NPC50-50W and NPC50-100W series). The advanced model features include  substrate scaling, pad geometry scaling and part value selectability.


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OML VNA modules are universally compatible with 20 GHz network analyzers

November 8, 2012

OML announces a direct connect configuration that supports millimeter wave S-parameter measurements using the ZVA series network analyzer from Rohde & Schwarz. This entry-level configuration offers engineers the versatility to connect VxxVNA2 series modules directly to the front panel of a four-port dual-source vector network analyzer.


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Constant Wave introduces de-embedding software for VNAs

February 15, 2012
Constant Wave Inc., a developer and provider of measurement analysis software, announced the release of the latest version of its software for use with vector network analyzers: Spectro™ VNA Pro version 2.3.
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Anritsu and Wild River present S-parameter methods

TestBench
January 30, 2012

Anritsu_VNA Jon Martens of Anritsu and Al Neves of Wild River Technology used DesignCon 2012 to discuss high-confidence S-parameter measurement methodologies for 15 - 28 Gbpsec.


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