The citation reads as follows, “For the analysis, design and development of a host of frequency control products exhibiting state-of-the-art performance, including the development of extremely low noise crystal oscillator circuitry.” - Dr. Ajay Poddar to be awarded 2015 IFCS W.G. Cady Award
Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing.
Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif.
The U.S. Patent and Trademark Office has issued SRC Inc. a patent for the “Interleaved Beam Coherent Radar Apparatus and Processing Method,” an advanced radar scanning and processing technique that improves a radar’s ability to detect very slow moving targets, such as small unmanned aerial vehicles (UAVs), watercraft or personnel, with a very high scan rate.