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Items Tagged with 'scan'

ARTICLES

Agilent launches versatile benchtop boundary scan analyzer for electronic test

Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing.


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Agilent to demo new solutions enabling tests from prototype validation to inline high-volume manufacturing at IPC APEX

Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif.


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SRC receives patent for advanced radar technique

The U.S. Patent and Trademark Office has issued SRC Inc. a patent for the “Interleaved Beam Coherent Radar Apparatus and Processing Method,” an advanced radar scanning and processing technique that improves a radar’s ability to detect very slow moving targets, such as small unmanned aerial vehicles (UAVs), watercraft or personnel, with a very high scan rate.

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