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Items Tagged with 'RF'

ARTICLES

RFMD expands wireless product portfolio with integrated VGA

June 21, 2012

RF Micro Devices Inc., a global leader in the design and manufacture of high-performance radio frequency components and compound semiconductor technologies, announced the release of the RFVA0016 — a highly integrated one-quarter watt (1/4W) analog-controlled variable gain amplifier (VGA).


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RFMD to present at the Stephens Inc. Spring Investment Conference

May 30, 2012

RF Micro Devices, Inc., a global leader in the design and manufacture of high-performance radio frequency components and compound semiconductor technologies, announced that company executives are scheduled to present at the 2012 Stephens Inc. Spring Investment Conference in New York, NY on Wednesday, June 6, 2012, at 9:00 a.m. Eastern Time.


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Horizon House announces new conference in China - EDI CON 2013

May 22, 2012

EDI CONHorizon House has announced plans to launch the inaugural Electronic Design Innovation Conference (EDI CON 2013) in Beijing, China in March 2013 that will focus on design concepts and techniques of RF, microwave and high-speed digital components and systems in China


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RFMD to present at the Barclays Capital Global Technology, Media and Telecommunications Conference

May 15, 2012

RF Micro Devices, Inc. announced that company executives are scheduled to present at the 2012 Barclays Capital Global Technology, Media And Telecommunications Conference in New York, NY on Tuesday, May 22, 2012, at 10:15 a.m. Eastern Time.


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Microwave & RF Expo held in Paris

April 11, 2012

The Microwave & RF Exhibition that took place at Porte de Versailles, Paris from 3 to 5 April showcased products and services in the RF, microwave, wireless and fibre optic sectors.


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Multi-tone Testing Can Save Both Time and Money

March 14, 2012
RichardsonRFPDAR RF/Microwave Instrumentation has developed a product which uses a patented test process that adds additional test frequencies, or tones, for each test period, or dwell time. Rather than testing one tone per dwell period, we add additional tones to effectively increase the test efficiency by a factor approximately equal to the number of tones used.
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