Test and Measurement Channel
September 18, 2012
This application note is designed to provide you with the latest insights on how to best address the long list of test requirements when testing the voice quality of LTE UE, with the right VoIP test building blocks. Successfully providing voice support on LTE will require UE developers to bring together a host of new features and capabilities. Many of these items have been around for a while but have not yet been applied to mobile networking. Others are completely new. Regardless, bringing them together will likely cause significant test pain, as they will need to be tested in conjunction with LTE and/or IMS to be fully exercised.
September 17, 2012
The complexity of modern digital equipment has caused EMI/EMC susceptibility
testing to become increasingly important. Many EMC standards have been created
including MILSTD- 461, IEC 61000, ISO 11451 Automotive, EN 50, and FCC
part 15 that provide specific guidelines for EMC and EMI test methodologies. Early
standards required a CW carrier, or single tone with constant modulation as the
disturbance test signal. This article will discuss how a peak power sensor can replace an average
diode detector in a field probe to measure pulse power, improve repeatability and
increase dynamic range of the power measurement.
September 17, 2012
This paper provides a comprehensive review of modern automated load-pull, including a discussion of early impedance synthesis methods, and how they were improved with breakthrough innovations such as Focus MPTTM technology and systematic high-VBW sub-1 Î© test-fixture design techniques. More recent developments are next treated, including active-loop and active-injection impedance synthesis architectures, time-domain data acquisition, and advanced data processing and
August 13, 2012
There is a wide variety of coaxial connectors and cables available for use in the RF and Microwave spectrum. While often not much thought is given to these essential components, a misstep here can result in undesirable system degradation. Given that typical RF systems are comprised of any number of items, e.g. RF generators, amplifiers, attenuators, power meters, couplers, antennas, etc., it is not uncommon that a great deal of thought is given to these âhigh end devices while mundane items such as connectors and cables are often treated as an afterthought".
August 13, 2012
The Anritsu VectorStars Noise Figure Option 041 enables the capability to measure noise figure (NF), which is the degradation of the signal-to-noise ratio caused by components in a signal chain. The NF measurement is based on a cold source technique for improved accuracy. Various levels of match and fixture correction are available for additional enhancement. VectorStar is the only VNA platform offering a Noise Figure option enabling NF measurements from 70 kHz to 125 GHz. It is also the only VNA platform available with an optimized noise receiver for measurements from 30 to 125 GHz.
July 13, 2012
This White Paper begins by explaining how fading occurs and describing traditional methods of radio channel
emulation. It continues to describe the innovative, all-digital, approach used in the Aeroflex 7100 Series Radio Test
Platform. It will be demonstrated that the Aeroflex platform allows realistic testing of LTE user equipment to be performed
in a way that is impractical with traditional methods.
May 14, 2012
The introduction of this digital transmission
technology has made it necessary to deal with peak power levels up to 20
dB above the average value. All of the RF power components must be capable of
handling these high voltage peaks to avoid break down, or flash over.
May 14, 2012
National Instruments has redefined the traditional
approach by combining PXI hardware and NI LabVIEW system design software, leveraging commercial technologies such as multicore microprocessors, user-programmable
FPGAs, PCI Express hardware, and system design software to meet the flexibility and scalability demand for future high-frequency test and measurement applications.
April 13, 2012
Agilent April White Paper
April 6, 2012
Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with the 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.