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Test and Measurement Channel

How to measure 5-nanosecond rise/fall time in pulsed power amplifiers

March 14, 2012
Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with Agilent Technologies 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

Multi-tone Testing Can Save Both Time and Money

March 14, 2012
AR RF/Microwave Instrumentation has developed a product which uses a patented test process that adds additional test frequencies, or tones, for each test period, or dwell time.

Richardson RFPD Test & Measurement Capabilities

March 1, 2012
Richardson RFPD's interactive Online Product Selector provides quick, easy access to our extensive selection of RF Test and Measurement components, cable assemblies, and accessories from the industry's top brands.

Solutions for LTE-Advanced Physical Layer Design and Test

February 15, 2012
LTE-Advanced (LTE-A) is an emerging mobile communications standard that boasts a number of significant benefits, including the ability to take advantage of advanced topology networks and achieve target peak data rates of 1 Gbps in the downlink and 500 Mbps in the uplink. This white paper covers using signal generation and analysis to overcome challenges associated with carrier aggregation.

Electronically Scanned Arrays for Fast Testing of Large Antennas

February 12, 2012
This paper discuss the adaptation of the fast multi-probe technology to an existing classical planar near field facility through the manufacturing, installation and test of a partial demonstrator in Thales Alenia in Toulouse.

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