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Test and Measurement Channel

Accurate System Level Design with Low Noise Amplifier's BlackBox Models

May 15, 2013

To amplify weak signals received by the antenna in communication systems, low noise amplifiers (LNAs) are deployed. LNAs are used in various applications such as GPS receivers, wireless data systems, satellite communications, cellular handsets, radio systems, etc.

5 RF Transmitter Measurements Every Engineer Should Know

May 15, 2013

RF transmitters are an essential part of modern communications. Designed and assembled from core RF components, RF transmitters have many different forms and applications. We often think of RF transmitters in wireless communications, but the concept applies equally to wired applications such as cable television.

Understanding VNA Calibration

May 15, 2013

In this guide, the concept of calibration is presented and discussed in detail. Specific topics to be covered include how to configure the VNA for calibration, types of calibration and calibration kits. A minimal amount of calibration mathematics and theory will also be covered.

Using RF Recording Techniques in PXI to Capture and Analyze Interference in the Signal Environment

May 15, 2013

The airwaves are becoming increasingly crowded as demand for RF spectrum continues to grow. As a result, every type of wireless communication system faces a complex and unpredictable signal environment.

Techniques for Precise Cable and Antenna Measurements in the Field

May 15, 2013

Cable and antenna measurements are often required to verify and troubleshoot the electrical performance of RF and microwave transmission systems and antennas. Measurements are often made along the coaxial cable connecting a transmitter to its antenna and/or between an antenna and its receiver.

System Noise-Figure Analysis for Modern Radio Receivers: Part 1, Calculations for a Cascaded Receiver

May 9, 2013

This article ties together the fundamenal definition of noise figure, equation-based analysis of cascade blocks involving mixers, and typical lab techniques for measuring noise figure. In this Part 1 we show how the cascaded noise figure equation is modified by the presence of one or mixers and we derive the applicable equations for a number of popular downconversion architectures. We continue this discussion in Part 2 of this series where we describe the Y-factor method of noise-figure measurement. In Part 2 we focus on the case of a mixer as the device under test in order to identify appropriate measurement methods for mixer noise figures that can be validly applied using the cascade equations derived in Part 1.

Solutions for Design and Test of Downlink 8x8 LTE MIMO

April 16, 2013

The new application note “Solutions for Design and Test of 8x8 LTE MIMO” is designed to help you get insight into solving tough measurement problems in a unique way for both the design and manufacturing environments by explaining how to combine simulation with test solutions to realize high-performance 8x8 MIMO designs.

Advanced VNA Cable Measurements

April 16, 2013

This field brief will discuss phase-matching cables, S-parameter definitions as they apply to cable characterization and other cable parameters such as Phase Shift and Group Delay. Advanced Time-Domain measurements will also be presented as enhancements to the well-known Distance-to-Fault (DTF) techniques. In addition, diagnostic tools like the Smith Chart will be briefly described.

StarMIMO

April 2, 2013

The primary goal of the MIMO OTA measurement system is to be able to compare Multi-antenna/MIMO devices and algorithms based on their throughput performances when tested against spatial channel models. All critical parts of the mobile terminal design (antennas, RF front-end, baseband processing) are tested in an end-to-end configuration. This document aims to present all the most relevant technical features of the MVG StarMIMO system relative to the MIMO OTA measurement technique with anechoic chambers.

Modern VNA Solutions Improve On-wafer Measurement Efficiency

March 20, 2013
In this white paper we look at the impact of calibration downtime during on-wafer testing and discuss how recent advances enable longer time periods between calibrations.

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