Test and Measurement Channel

This White Paper begins by explaining how fading occurs and describing traditional methods of radio channel emulation. It continues to describe the innovative, all-digital, approach used in the Aeroflex 7100 Series Radio Test Platform. It will be demonstrated that the Aeroflex platform allows realistic testing of LTE user equipment to be performed in a way that is impractical with traditional methods.

The mismatch between these real loads and the amplifier's output impedance result in a percentage of the forward power being reflected back to the amplifier. In some cases, excessive reflected power can damage an amplifier and precautions that may affect forward power are required. This Application note highlights the major RF amplifier characteristics that impact forward power as well as net power allowing the use of Ohm's law, even when conditions are far from ideal.

The introduction of this digital transmission technology has made it necessary to deal with peak power levels up to 20 dB above the average value. All of the RF power components must be capable of handling these high voltage peaks to avoid break down, or flash over.

Agilent April White Paper

Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with the 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

This white paper summarizes the technology options for supporting voice and short message service (SMS) in LTE, including circuit switched fallback (CSFB), SMS over SGs, and voice over LTE (VoLTE). It includes background information on the standardization process, and the commercial implications for the different options. The white paper also addresses test and measurement requirements resulting from the support of voice and SMS in LTE.

Improving the accuracy of your microwave test and measurement equipment becomes increasingly important when high frequency devices are used in the transmission paths of radio, cellular, satellite and digital communications. This discussion helps to solve problems with measurement errors during and after calibration of your microwave test instrument.

Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with Agilent Technologies 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

AR RF/Microwave Instrumentation has developed a product which uses a patented test process that adds additional test frequencies, or tones, for each test period, or dwell time.

Wide bandwidth, high resolution AWGs
Measurement needs have driven the development of high-bandwidth AWGs, but they lacked accuracy and high resolution. Until now, AWG technology forced serious trade-offs between either high resolution or wide bandwidth. With the new Agilent M8190A 12 GSa/s arbitrary waveform generator, you will get both in one instrument!