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White Papers

SISO to MIMO: Moving Communications from Single-Input

January 12, 2012
Mark Elo, Marketing Director of RF Products, Keithley Instruments

Optical Lithography Based Low Cost PHEMT Process

January 12, 2012
DC to 85GHz TWA and Ka-band 4.9W Power Amplifier Using an Optical Lithography Based Low Cost PHEMT Process

Buying a Signal Analyzer

January 12, 2012
Keithley Instruments

De-mystifying Single Carrier FDMA: The New LTE Uplink

January 12, 2012
This article focuses on the physical layer (“Layer 1”) characteristics of the LTE uplink, describing the new Single-Carrier Frequency Division Multiple Access (SC-FDMA) transmission scheme and some of the measurements associated with it. Understanding the details of this new transmission scheme and measurements is a vital step towards developing LTE UE designs and getting them to market.

50 V LDMOS: An Ideal RF Power Technology for ISM, Broadcast, and Radar Applications

January 12, 2012
RF LDMOS (RF Laterally Diffused MOS), hereafter referred to as LDMOS, is the dominant device technology used in high power wireless infrastructure power amplifier (PP applications for frequencies ranging from less than 900 MHz to 3.8 GHz.

Upfront RF Planning Speeds System-level Analysis

January 12, 2012
White paper discussing the advantages of dedicated system-level tool over spreadsheets.

Orthogonal Frequency Division Multiplexing

January 12, 2012
Orthogonal frequency division multiplexing (OFDM) is a form of digital modulation used in a wide array of communications systems. This paper will explain what OFDM is, why it’s important, where it’s used, and what test instrumentation is required to maintain it.

RF Wafer Testing: An Acute Need, and Now Practical

January 12, 2012
Carl Scharrer, Keithley Instruments, Inc. RF Tests Becoming Indispensable

Software-defined Radio: The next wave in RF test instrumentation

January 12, 2012
Michael Millhaem, Principal RF Application Engineer Keithley Instruments, Inc. Test equipment manufacturers are constantly challenged to develop new solutions for testing their customers’ latest devices, but they’ve traditionally developed specialized hardware to meet this challenge....

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