November 17, 2015
We will first present an overview of phased-array antenna fundamentals and basic Active Electronically Scanned Array (AESA) principles and challenges, and then we will explain how planar solutions can help with form-factor issues. We will also show how planar solutions at frequencies at or above X-band require increased integration, as well as highlighting some associated challenges.
October 20, 2015
High-performance inertial systems provide accurate platform heading information in a variety of applications and operational environments. However, the magnetometers used are susceptible to measurement distortion in the presence of any magnetic material. This white paper documents product integration and on-board calibration procedures that mitigate distortion and optimize overall product performance.
October 20, 2015
A key factor in designing Wireless Power Transfer (WPT) devices is the performance of the power transfer efficiency between coupled coils and resonators. Consequently, the ability to characterize these components and measure power transfer efficiency in real-time is paramount. Download the new application note to learn the theory of WPT, measurement requirements for components in WPT systems and how to characterize key parameters.
October 20, 2015
Keysight's rugged, dependable FieldFox handheld analyzers are designed to deliver precise, lab-grade measurements up to 50 GHz. Explore Keysight's FieldFox application note and webcast library, to help you solve your toughest measurement challenges to Ka band and beyond. Includes these three app notes updated to cover measurements up to 50 GHz: Correlating Microwave Measurements between Handheld and Benchtop Analyzers; Precision Validation, Maintenance and Repair of Satellite Earth Stations FieldFox Handheld Analyzers; Techniques for Precision Validation of Radar System Performance in the Field. Explore FieldFox. Get app notes, webcasts & more.
September 17, 2015
Electronic Warfare Fundamentals Poster.Â This poster contains a radar warning receiver and DRFM based jammer block diagrams, a compare and contrast of Radar versus EW, basic equations, cross-eye jamming, modern jamming techniques, three areas of EW; common acronyms and the latest hardware and software for electronic warfare test and measurement.
September 15, 2015
Top methods to analyze amplifiers compression characteristics and performance of peak power capabilities.
August 28, 2015
Modern modular digitizers, like the Spectrum M4i series PCIe digitizers, offer greater bandwidth and higher resolution at any given bandwidth than ever before. Although they are in the class of general purpose measuring instruments they are capable of many RF and lower microwave frequency measurements. This article focuses on some examples of common RF measurements that can be performed with these modular digitizers.
August 17, 2015
The MicroApps program at the IEEE MTT-S International Microwave Symposium (IMS2015) held in Phoenix, Arizona, had nearly 80 presentations covering the hottest topics in RF/uW. Â If you missed this important event, you can still get an official copy of the CD containing the presentation material - compliments of Keysight Technologies. Order now and as a bonus, get access to the content presented at the inaugural RF Boot Camp session!
August 17, 2015
Today's AWGs can address a broad range of applications and test cases. This primer discusses characteristics and fundamentals of arbitrary waveform generation and the different implementations available in the market. It also shows examples how to generate digital, multi-level and PAM4 signals, wireless and modulated waveforms, multi-carrier as well as coherent optical signals. It explains the different methods of wideband IQ modulation and up-conversion, calibration and correction, and wrap-around handling for RF/wireless signals.
July 21, 2015
Intermodulation distortion (IMD) is an important consideration in microwave and RF component design. A common technique for testing IMD is the use of two tones. Two-tone testing for IMD has been used to characterize the non-linearity of microwave and RF components, both active and passive, for a very long time. Traditionally, this has been done at fixed frequencies using multiple signal generators, a combiner, and a spectrum analyzer. Because IMD varies with frequency, these measurements must be repeated at various frequencies to get a clear picture of what a deviceâ??s true behavior is across its specified operating range. This can be a time consuming process using the traditional signal generators and spectrum analyzers. The Anritsu VectorStar MS4640B Series Vector Network Analyzers can be used to quickly and accurately make S parameter, gain compression, fixed and swept frequency IMD measurements using a single cable connection to the DUT.