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White Papers

GaAs in Space

January 17, 2012
TriQuint Semiconductor

Consider the Costs of Not Migrating Your Test System

January 17, 2012
Test system migration and modernization doesn’t have to be expensive and fraught with hassle. In fact, carefully planned migration can maximize test-system efficiency, performance and readiness while providing meaningful cost savings.

50 V LDMOS: An Ideal RF Power Technology for ISM, Broadcast, and Radar Applications

January 17, 2012
RF LDMOS (RF Laterally Diffused MOS), hereafter referred to as LDMOS, is the dominant device technology used in high power wireless infrastructure power amplifier (PP applications for frequencies ranging from less than 900 MHz to 3.8 GHz.

Upfront RF Planning Speeds System-level Analysis

January 17, 2012
White paper discussing the advantages of dedicated system-level tool over spreadsheets.

SISO to MIMO: Moving Communications from Single-Input

January 17, 2012
Mark Elo, Marketing Director of RF Products, Keithley Instruments

De-mystifying Single Carrier FDMA: The New LTE Uplink

January 17, 2012
This article focuses on the physical layer (“Layer 1”) characteristics of the LTE uplink, describing the new Single-Carrier Frequency Division Multiple Access (SC-FDMA) transmission scheme and some of the measurements associated with it. Understanding the details of this new transmission scheme and measurements is a vital step towards developing LTE UE designs and getting them to market.

Orthogonal Frequency Division Multiplexing

January 17, 2012
Orthogonal frequency division multiplexing (OFDM) is a form of digital modulation used in a wide array of communications systems. This paper will explain what OFDM is, why it’s important, where it’s used, and what test instrumentation is required to maintain it.

RF Wafer Testing: An Acute Need, and Now Practical

January 17, 2012
Carl Scharrer, Keithley Instruments, Inc. RF Tests Becoming Indispensable

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