advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

White Papers

Minimizing PIM Generation From RF Cables and Connectors

Understanding mechanical tolerances, coaxial design details and connector materials used in cable assemblies helps produce communications equipment with the lowest levels of passive intermodulation (PIM).

Creating a Solution for Testing Frequency-Hopping Spread Spectrum Devices

Wide bandwidth, high resolution AWGs
Measurement needs have driven the development of high-bandwidth AWGs, but they lacked accuracy and high resolution. Until now, AWG technology forced serious trade-offs between either high resolution or wide bandwidth. With the new Agilent M8190A 12 GSa/s arbitrary waveform generator, you will get both in one instrument!

Solutions for LTE-Advanced Physical Layer Design and Test

LTE-Advanced (LTE-A) is an emerging mobile communications standard that boasts a number of significant benefits, including the ability to take advantage of advanced topology networks and achieve target peak data rates of 1 Gbps in the downlink and 500 Mbps in the uplink. This white paper covers using signal generation and analysis to overcome challenges associated with carrier aggregation.

Electronically Scanned Arrays for Fast Testing of Large Antennas

This paper discuss the adaptation of the fast multi-probe technology to an existing classical planar near field facility through the manufacturing, installation and test of a partial demonstrator in Thales Alenia in Toulouse.

Leveraging OFDMA Technology for HLS Applications

In this paper we take a closer look at various OFDMA based Broadband Wireless Access (BWA) for Homeland Security (HLS) applications and their implementation. Our primary focus is to understand the capabilities required from these applications and to show how flexibility and controllability of system components can help address these requirements.

Measuring Leakage Current in RF Power Transistors

The published specifications for leakage current in RF power devices are often a source of concern and confusion for engineers and technicians. This paper examines the real meaning behind the leakage current specifications and offers guidance on properly testing a device for leakage current.

Turn up the Heat: An Electrical-Thermal MMIC Design Flow

Nov. 2011 White paper

Wireless InSite 2.6 - New Capabilities Overview

We have a presentation available on our website that highlights Wireless InSite’s new capabilities. This short slideshow provides a more detailed look at the features the new release has to offer.

The Quest for a Rugged Transistor

Post webinar white paper for attendees

Noise Figure Measurement without a Noise Source on a Vector Network Analyzer

This application note describes the noise figure measurement using the R&S Vector Network Analyzers of the ZVA and ZVT series. It explains the concept of measuring noise figure without the need for a characterized noise source. Furthermore, it discusses different measurement applications and the respective setup and implications. Some examples guide through the instrument setups and show measurement results as well.

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement