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White Papers

The Advantages of Outsourcing Your RF/Microwave Assembly to an Onshore Contractor

April 6, 2012
Shifting landscapes suggest RF/Microwave companies keep manufacturing closer to home. The outsourcing decision for RF/Microwave (RF/MW) companies, however, has a unique set of circumstances when compared to conventional digital electronics.

High Temperature, High Power RF Life Testing of GaN on SiC

April 6, 2012
As GaN power device technology matures and gains acceptance suppliers must prove its reliability. This paper will provide an overview of the testing approaches used to establish failure rates and will provide a comparison of DC and RF based HTOL methods. The primary focus of this paper will be the high power RF HTOL test method used by M/A-COM Technology Solutions to qualify its new MAGX line of discrete GaN on SiC RF Power Transistors.

Voice and SMS in LTE

April 6, 2012
This white paper summarizes the technology options for supporting voice and short message service (SMS) in LTE, including circuit switched fallback (CSFB), SMS over SGs, and voice over LTE (VoLTE). It includes background information on the standardization process, and the commercial implications for the different options. The white paper also addresses test and measurement requirements resulting from the support of voice and SMS in LTE.

Improving Measurement Accuracy for High Frequency RF Connectors

April 6, 2012
Improving the accuracy of your microwave test and measurement equipment becomes increasingly important when high frequency devices are used in the transmission paths of radio, cellular, satellite and digital communications. This discussion helps to solve problems with measurement errors during and after calibration of your microwave test instrument.

New Low-Profile Hermetic LTCC Mixer Series Raises the Bar for Reliability, Performance, and Price

March 14, 2012
A new family of ultra-reliable mixers, developed by Mini-Circuits, combines low-temperature cofired ceramic (LTCC) circuitry and specially selected semiconductor dice in a hermetically sealed case at 1/10th the price of comparable products on the market. Fully automated, tightly-controlled, and highly repeatable processes ensure excellent performance at temperatures up to 125 degrees C.

How to measure 5-nanosecond rise/fall time in pulsed power amplifiers

March 14, 2012
Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with Agilent Technologies 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

Wireless Transmitter IQ Balance and Sideband Suppression

March 14, 2012
This application note presented by Richardson RFPD discusses the major causes of nonideal sideband suppression and discusses design considerations for component selection and PCB design/layout.

Multi-tone Testing Can Save Both Time and Money

March 14, 2012
AR RF/Microwave Instrumentation has developed a product which uses a patented test process that adds additional test frequencies, or tones, for each test period, or dwell time.

Minimizing PIM Generation From RF Cables and Connectors

March 9, 2012
Understanding mechanical tolerances, coaxial design details and connector materials used in cable assemblies helps produce communications equipment with the lowest levels of passive intermodulation (PIM).

Creating a Solution for Testing Frequency-Hopping Spread Spectrum Devices

February 15, 2012
Wide bandwidth, high resolution AWGs
Measurement needs have driven the development of high-bandwidth AWGs, but they lacked accuracy and high resolution. Until now, AWG technology forced serious trade-offs between either high resolution or wide bandwidth. With the new Agilent M8190A 12 GSa/s arbitrary waveform generator, you will get both in one instrument!

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