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Techniques for Precise Time Domain Meas. in the Field

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1/23/13 1:00 pm to 1/23/13 2:00 pm EST

Agilent 468x60 FF 23jan13

FieldFox Handheld Analyzers Education Series

Title: Techniques for Precise Time Domain Measurements in the Field

Date: January 23, 2013

Time:10:00 AM PT/ 1:00 PM ET/ 6:00 PM UTC

Presented by: Agilent Technologies

Sponsored by: Gap Wireless

Overview:
High-performance communications and radar systems require a quality transmission path for the propagation of RF and microwave signals. Component and system performance is often verified by measuring the frequency response of the reflection and/or transmission properties using a vector network analyzer. If a component or portion of a system becomes damaged or was improperly tuned, a frequency response measurement will only report reduced performance and does not provide information regarding the location and type of fault along the signal path. In this case, a time domain measurement provides a superior method of locating individual discontinuities and the associated magnitude for each mismatch. Fortunately, field-ready vector network analyzers have both frequency domain and time domain capability allowing the verification and troubleshooting of the electrical performance of RF and microwave transmission systems and antennas.

This webcast introduces time domain and distance to fault (DTF) measurement techniques for identifying the location and types of discontinuities while operating in the field. We will describe the relationship between frequency domain measurements and time domain transforms and their relationships to time resolution and range. We will discuss the proper techniques for characterizing band-limited devices, such as couplers, filters, antennas and waveguide components, and wideband devices, such as cables and connectors. We will also discuss time domain “gating”, a powerful feature that effectively isolates discontinuities in the time domain just as a filter would isolate signal energy in the frequency domain. One application of gating is to examine the electrical performance of a single component or discontinuity while the device is still connected within a system.

Another example discussed in this webcast relates to gating out the effects of a single out-of-spec discontinuity thereby allowing the system performance of all the remaining components to be examined. Measurement examples will be provided using Agilent’s handheld RF and microwave FieldFox vector network analyzers (VNA) and cable and antenna test (CAT) analyzers.

Presenter:
Tom Hoppin, Business Development Engineer, Agilent Technologies

Presenter Bio:
Tom started his working career as an electronic aviation technician in the US Marine Corps. After his service in 1973, he joined Hewlett-Packard as a manufacturing technician. During his career at HP, he moved from manufacturing to production engineering and was promoted to engineer in 1989. Since then, he has held a number of engineering and management roles at HP and Agilent, focused on test system design and spectrum analysis. Tom retired in 2009 and has returned to Agilent as a contract application engineer, helping to launch the new FieldFox handheld analyzers. Tom enjoys woodworking, cycling and sailing.

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