advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement

RF/uW Measurement Uncertainty: Calculate, Characterize, Minimize

/ Print /
| ShareMore
/ Text Size +
1/17/13 1:00 pm to 1/17/13 2:00 pm EST

Agilent A/D 468x60 17jan13

 

Agilent in Aerospace/Defense – Webcast Series

Title
RF/uW Measurement Uncertainty: Calculate, Characterize, Minimize

Date
January 17, 2013; 10am PT/ 1pm ET/ 6pm UTC

Abstract
Measurements include uncertainties introduced by the test setup and measuring equipment. In this presentation, these sources of uncertainty are referred to as mismatch uncertainty and instrumentation uncertainty, respectively. Mismatch uncertainty arises from partial reflection of an incident wave at the interface between two components of a test setup. These components include cables, connectors, adapters, the device under test (DUT), and test instrumentation. On the other hand, instrumentation uncertainty occurs due to performance limitations of test instrumentation and switching of internal elements such as mechanical attenuators and resolution bandwidth. The accuracy of a measurement is improved if the total measurement uncertainty is reduced. This webcast describes simple and advanced measurement application techniques to reduce and in some cases eliminate the uncertainty from specific sources. In addition, it provides practical examples to minimize uncertainty, characterize mismatch uncertainty, and calculate the total uncertainty of a measurement.

Who should view this webcast
Aerospace & Defense, Manufacturing, and Research & Development engineers that use electronic test equipment to make signal measurements.

Presenter
Antonio Castro, Hardware R&D Engineer, Agilent Technologies

Antonio Castro received a M.S. degree in electrical engineering from Stanford University in 2006 and joined Agilent Technologies in 2000. Currently, he is a Hardware R&D Electrical Engineer with responsibilities spanning manufacturing, new product introduction, and research & development. Most of his experience is with signal analyzers; however, he has developed test equipment as well as worked with a variety of gear doing component and system characterization. In addition, he has worked with electrical inspection software and has been involved with equipment specification settings, regulatory testing, and measurement uncertainty characterization. His experience with signal analyzers includes many projects involving baseband IQ, front-end frequency extension, external mixing, signal conditioning, and signal control.

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement