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81st ARFTG Microwave Measurement Symposium

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6/7/13 to 6/7/13
Grand Hyatt
Seattle, WA
United States

Metrology for High Speed Circuits and Systems

Beyond the focus topic of Metrology for High-Speed Circuits and Systems, technical papers describing original work in all areas of microwave and millimeter wave measurement will be presented. Other topics include, but are not limited to:

  • Linear and Nonlinear Vector Network Analysis
  • Multiport and Differential Measurement
  • On-Wafer Microwave Measurement
  • Emerging Technologies (RF-MEMS, CNT Devices, etc…)
  • Nondestructive In-Circuit Testing
  • Complex Waveform Analysis
  • Wideband Measurement for High-Speed Communication Systems
  • Other areas of microwave and millimeter wave measurement


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