MoreMetrology for High Speed Circuits and Systems
Beyond the focus topic of Metrology for High-Speed Circuits and Systems, technical papers describing original work in all areas of microwave and millimeter wave measurement will be presented. Other topics include, but are not limited to:
- Linear and Nonlinear Vector Network Analysis
- Multiport and Differential Measurement
- On-Wafer Microwave Measurement
- Emerging Technologies (RF-MEMS, CNT Devices, etc…)
- Nondestructive In-Circuit Testing
- Complex Waveform Analysis
- Wideband Measurement for High-Speed Communication Systems
- Other areas of microwave and millimeter wave measurement
