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Overview
Extensive efforts are underway to standardize on a next generation platform for performance testing of wireless devices, taking into account LTE, A-GPS, uncertainty budgets and use of head/hand phantoms. This Forum provides an understanding of system performance and presents the core elements - such as the chamber, software and instrumentation - that facilitate systematic and repeatable measurements of MIMO devices. A panel discussion with the speakers from ETS-Lindgren, Agilent Technologies, Spirent, and Elektrobit concludes the Forum.
Moderated by
Bryan Sayler, Vice President and General Manager, ETS-Lindgren
Presentations
Antenna Pattern Measurement: The Engineer's Window into MIMO OTA Performance
By Moray Rumney, Lead Technologist, Agilent Technologies
Product Performance Evaluations in MIMO Environment Simulators
By Dr. Michael D. Foegelle, Director of Technology Development, ETS-Lindgren
Measuring MIMO Device Performance using Realistic Over-the-Air Testing Methods
By Doug Reed, Solutions Architect, Spirent Communications
Novel Aspects of MIMO OTA Using an Anechoic Chamber
By Jukka-Pekka Nuutinen, Senior Specialist, Test Tools, EB (Elektrobit)
Sponsored by:
Agilent Technologies
ETS-Lindgren
Elektrobit
Spirent Communications
