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Agilent in Aerospace/Defense – Webcast Series
Fast and Accurate Frequency Converter Characterization
April 19, 2012; 10am PT/ 1pm ET/ 5pm UTC
This webcast discusses new methods for characterizing frequency converters with external or embedded local oscillators, using Agilent's PNA-X high-performance network analyzer and the latest measurement algorithms. Compared to legacy systems built around spectrum analyzers and standalone signal sources, modern VNA-based systems are much faster, and more accurate, and they can accomplish many measurements with a single connection to the device under test. Featured measurements include a new method for measuring group delay without the use of reference or calibration mixers, plus gain compression versus frequency, swept intermodulation distortion, and source-corrected noise figure.
Engineers or technicians in R&D or manufacturing that need to fully characterize the behavior of RF or microwave frequency converters.
David Ballo is a Senior Application Engineer with 32 years of experience at Agilent Technologies’ Component Test Division in Santa Rosa, California. After graduating from the University of Washington in Seattle, he spent ten years in R&D designing analog and RF circuit for signal analyzers. Since then, he has worked on developing and presenting seminars and papers, and writing application notes and technical articles on a wide variety of network- and spectrum-analyzer measurement topics.