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RF Back to Basics: Part 1 - Signal Analysis

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1/25/12 1:00 pm to 1/25/12 2:00 pm EST

RF Back to Basics: Part 1 - Signal Analysis

Innovations in Signal Analysis Webcast

Abstract:

Learn why spectrum analysis is important for a variety of applications and how to measure system and device performance using a spectrum analyzer. We will begin with an introduction to spectrum analyzers and a discussion of the theory of operation. We will examine the instrument's major components and their significance as well as the key spectrum analyzer specifications that are important for your application. Current measurement challenges and methods to address them will also be discussed.

Who should attend:

Engineers, technicians and students new to RF measurements or those needing a refresher on the basics of RF Test.

Presenter:

Erik Diez, Senior Product Manager, Agilent Technologies

Erik Diez is a Senior Product Manager in the Agilent Technologies Microwave and Communications Division in Santa Rosa, California. In his 32-year career with the company, he has held numerous roles in marketing, R&D, and application engineering related to a variety of signal analysis and generation products. Erik holds a BSEE from UC Davis and an MSEE from UC Berkeley.

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