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Design Right the First Time: Understanding how Dielectric Constant (Dk) Test Methods Affect Time to Market


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10/24/17 11:00 am to 10/24/17 12:00 pm EST

Event Description

Technical Education Webinar Series

Title: Design Right the First Time: Understanding how Dielectric Constant (Dk) Test Methods Affect Time to Market

Date: October 24, 2017

Time: 8am PT/ 11am ET

Sponsored by: Rogers Corporation

Presented by: John Coonrod, Technical Marketing Manager, Rogers Corporation, Advanced Connectivity Solutions


There are many things to consider when designing microwave and millimeter-wave printed circuit boards (PCB’s). RF engineers need to work through typical tradeoffs to get the optimum RF performance of the circuit for the intended application. The circuit RF properties are affected by normal variations in the high frequency circuit material, PCB fabrication processes and end-use environmental conditions.

This webinar will address real-world issues which can alter the RF performance of a PCB. Some of these issues are design and PCB construction specific. We will expose uncommon relationships between circuit design and material affects related to the RF performance of the printed circuit. The topics which will be covered are:

  • Optimum Design Dk values and the potential variations
  • Normal variations of high frequency circuit materials
  • PCB fabrication influences which impact RF performance
  • End-use environmental conditions and potential impact on PCB RF performance

Presenter Bio:

John Coonrod is the Technical Marketing Manager for Rogers Corporation, Advanced Connectivity Solutions Division. John has 30 years of experience in the Printed Circuit Board industry. About half of this time was spent in the Flexible Printed Circuit Board industry regarding circuit design, applications, processing and materials engineering. The past fifteen years have been spent supporting High Frequency Circuit materials involving circuit fabrication, providing application support and conducting electrical characterization studies. John is the Chair for the IPC D24C High Frequency Test Methods Task Group and holds a Bachelor of Science, Electrical Engineering degree from Arizona State University.