advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement

A Guide to Making RF Measurements for Signal Integrity Applications

/ Print /
| ShareMore
/ Text Size +
1/24/17 2:00 pm EST

Anritsu

Technical Education Webinar Series

Title: A Guide to Making RF Measurements for Signal Integrity Applications

Date: January 24, 2017

Time: 11am PT/ 2pm ET

Presented by: Stanley Oda, Product Manager

Sponsor: Anritsu

Overview:
Designing a system for Signal Integrity requires a great deal of knowledge and tremendous effort from all disciplines involved. Higher data rates and more complex modulation schemes are requiring digital engineers to take into account the analog and RF performance of the channels to a much greater degree than in the past. Moreover, increasing performance demands are requiring digital engineers move from oscilloscopes and TDRs to vector network analyzers (VNAs), with which they may be less familiar.

Correspondingly, RF measurement groups within companies are being called on by their digital colleagues to help them with making VNA measurements. This webinar will review signal integrity-based VNA measurements for digital engineers and correlate VNA measurements to key signal integrity parameters for RF engineers.

Who Should Attend:
Students, engineers and managers that want to learn more about using frequency based test and measurement equipment for conventional time domain tests. This presentation will also benefit engineers with and without Vector Network Analyzer experience understand the relationship between s-parameters measurements and key signal integrity parameters.

What You Will Learn:
This presentation will review signal integrity measurements from both a frequency domain and time domain perspective. It will cover signal integrity terms and measurements, a usage comparison of BERTs, VNAs and TDRs for SI applications, and time and frequency domain measurement considerations for SI testing.

Presenter Bio:
Stan Oda has a BSEE from the Massachusetts Institute of Technology. He has worked for several companies in the electronic test and measurement industry before coming to Anritsu for the past 3 years as a product manager in the Vector Network Analyzer group.

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement