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Learn to Make Power Amplifier Tests Faster!
March 6, 2014; 10am PT/1pm ET
WHAT IS THIS WEBCAST ABOUT?
The continued proliferation of wireless mobile devices has created pressure to simultaneously reduce cost and increase data throughput without sacrificing battery life. These two requirements create conflicting challenges for test engineers because they must attempt to reduce overall test system cost and test times despite the added test system cost and complexity inherent to techniques such as digital predistortion (DPD) and envelope tracking.
This webcast will address the key issues in power amplifier test systems including:
* Key test challenges
* Test system techniques to optimize throughput
* New emerging technologies such as envelope tracking and DPD and their implications
WHO SHOULD VIEW THIS WEBCAST?
* Wireless device: test engineers, design engineers, manufacturing engineers, test engineering managers, design engineering managers.
* Power Amplifier: designers, test engineers, test engineering managers, manufacturing engineers, manufacturing engineering managers.
Joan Gibson, Product/Solutions Marketing Engineer, Agilent Technologies
Joan Gibson joined HP/Agilent in 1987. Joan has over 19 years of experience in RF and Microwave applications across a range of different test and measurement products, with over 12 years of experience as a Product /Solutions Marketing Engineer. Currently Joan works as a solution marketing engineer based in Santa Rosa, California, focusing on Microwave and RF signal analyzers in modular form factors such as PXI and AXIe. Joan holds a Bachelor of Science in Electrical Engineering degree from Santa Clara University, Santa Clara, California.
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