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Overcome LTE-A UE Design Test Challenges with Agilent’s New UXM

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2/13/14 to 2/13/14

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Agilent E7515A UXM Wireless Test Set
Assess Design Readiness with Greater Confidence

PHOTO Agilent product 13feb14

 

Title: Overcome LTE-A UE Design Test Challenges with Agilent’s New UXM

Date: Thursday, February 13

Times:
7:00am Pacific / 10:00am Eastern / 4:00pm Central European
10:00am Pacific / 1:00pm Eastern / 7:00pm Central European

Why this webcast is important:
LTE-Advanced Carrier Aggregation provides new levels of data throughput that are achieved through aggregating fragmented spectrum and using complex antenna designs. This presents new challenges for LTE UE and chipset designers. This webcast discusses the top three test challenges that engineers face, the limitations in prior generation test architectures, and how the test challenges are overcome with Agilent's new E7515A UXM Wireless Test Set.

Who should attend:
Engineers and technicians involved in the design and test of cellular chipsets and UE's incorporating LTE and other cellular technologies.

Presenter & Bio:
Joaquin Torrecilla, R&D Manager for Wireless R&D Test Sets
Joaquin Torrecilla is a 22-year veteran of the wireless and conformance business, with experience in both testing and design of test systems and instruments. Currently, he is R&D Manager for Wireless Test Sets at Agilent, managing the UXM program. Previously, he was the CTO at AT4 wireless, where he was involved in the design of test systems for LTE/LTE-A, UMTS, HSPA, WiMAX, GSM, (E)GPRS and Bluetooth. He also taught on Telecom Networks and Services at the University of Malaga for 15 years.

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