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Novel Very-Near-Field Measurement Technique to Test Large Directional Antennas in Minutes

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10/30/13 11:00 am to 10/30/13 12:00 pm EDT

EMSCAN webinar 468x60 30oct13

Technical Education Webinar Series

Title: Novel Very-Near-Field Measurement Technique to Test Large Directional Antennas in Minutes

Date: October 30, 2013

Time:8:00 AM PT/ 11:00 AM ET/ 3:00 PM UTC

Sponsored by: EMSCAN

Presented by:  Ruska Patton, M.Sc., Director of Product Management, EMSCAN

Abstract:
Very-near-field antenna measurements have been performed with an array of probes to provide real-time pattern and radiated power measurements. One of the limitations of this approach has been that the antenna must be smaller than the sampling array. A new method will be explained which can measure an arbitrarily large antenna by combining together multiple very-near-field snapshots. Practical limitations and solutions will be discussed along with the presentation of real measurement results.

Presenter Bio:
Ruska Patton, M.Sc., Director of Product Management, is responsible for the evolution of EMSCAN's real-time near-field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming. Mr. Patton holds both a B.Sc. and M.Sc. in Electrical Engineering from the University of Saskatchewan. During his time at University, he was recognized with numerous IEEE awards and a distinguished research scholarship.

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