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Novel Very-Near-Field Measurement Technique to Test Large Directional Antennas in Minutes
Technical Education Webinar Series
Title: Novel Very-Near-Field Measurement Technique to Test Large Directional Antennas in Minutes
Date: October 30, 2013
Time:8:00 AM PT/ 11:00 AM ET/ 3:00 PM UTC
Sponsored by: EMSCAN
Presented by: Ruska Patton, M.Sc., Director of Product Management, EMSCAN
Very-near-field antenna measurements have been performed with an array of probes to provide real-time pattern and radiated power measurements. One of the limitations of this approach has been that the antenna must be smaller than the sampling array. A new method will be explained which can measure an arbitrarily large antenna by combining together multiple very-near-field snapshots. Practical limitations and solutions will be discussed along with the presentation of real measurement results.
Ruska Patton, M.Sc., Director of Product Management, is responsible for the evolution of EMSCAN's real-time near-field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming. Mr. Patton holds both a B.Sc. and M.Sc. in Electrical Engineering from the University of Saskatchewan. During his time at University, he was recognized with numerous IEEE awards and a distinguished research scholarship.