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Simulation and Measurement: Complementary Design Tools

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10/17/13 to 10/17/13

Playback video now available to stream.

Abstract:
The usual aim of electromagnetic simulation in design is to lower the number of prototypes to reduce costs and time to market. However, this is only possible when the EM simulator is given the correct input data that accurately represents the physical device. Then an excellent agreement between simulation and measurement can be expected. There are many possible causes of discrepancies between the two, including geometric differences (over-etching, over-milling, rounded corners), material properties (anisotropic dielectrics, surface roughness), installed performance (surrounding structures) and feed discrepancies (connector modeling).

This webinar will explore the relationship between simulation, using CST STUDIO SUITE®, and measurement, and explain what each domain is best suited for. In some situations measurement can be difficult to perform while simulation is simpler, and vice versa. Simulation allows many variations on a design to be investigated, using techniques such as parameter sweeps, sensitivity and yield analysis.

The webinar will also demonstrate how simulation can be used for what-if analysis and feasibility studies at early stage of design before first prototypes. Finally, the use of measured data to calibrate simulation will be shown. This is useful for hard-to-model phenomena like surface roughness or for the modeling of low-cost adapters.

Presenter bio:
Vratislav Sokol received M.Sc. and Ph.D. degrees in radioelectronics from the Czech Technical University in Prague in 2000 and 2004, respectively. He was a Post-Doctoral Research Associate with Cork Institute of Technology in Ireland where he dealt with an ultra-wideband transceiver. His activities are focused on microwave circuit design and modeling using electromagnetic field simulators and precise microwave measurement and calibration. Since 2006 he has been with CST as an application engineer.

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