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Maximize the Performance of Your RF Signal Analyzer

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5/30/13 2:00 pm to 5/30/13 3:00 pm EDT

National Instruments 468x60 30may13

Technical Education Training Webcast Series

 

Title: Maximize the Performance of Your RF Signal Analyzer

Date: May 30, 2013

Time: 11:00 AM PT/ 2:00 PM ET/ 6:00 PM UTC

Sponsored by: National Instruments

Presented by: David Hall, Senior Product Marketing Manager for RF and Communications

Using digital whiteboard technology in lieu of presentation slides, this webcast on RF signal analyzers introduces the theory of operation for RF signal analyzers, provides tips and tricks for making more accurate third-order distortion measurements, and addresses audience questions through live Q&A and screen-sharing with presenter, David Hall.

Abstract:
The RF signal analyzer is to the frequency domain what the oscilloscope is to the time domain – a general-purpose test instrument that can measure and display electrical signals. This webcast on RF signal analyzers introduces the theory of operation for the RF signal analyzer and provides tips and tricks for making the best third-order distortion measurements.

In the first part of the webcast, explore the architecture of both the single-stage and super-heterodyne RF signal analyzer. Here, learn about the basic principles of downconversion and the inherent challenges of image rejection. Next, explore the frequency plan of the superheterodyne RF signal analyzer design and how it accomplishes image rejection. In the end, you gain a fundamental understanding of RF signal analyzer architectures and how to optimize them for the best measurement performance.

Intermodulation distortion (IM3) and measurements such as third-order intercept (TOI) have long been highly important – yet often misunderstood – figures of merit that describe the linearity of an RF component or system. In the second half of this webcast, learn what these measurements describe, relating the characterization of third-order distortion products to linearity and spectral regrowth of modulated signals. Finally, take away tips and tricks for improving the accuracy of IM3 measurements, including isolating signal generator sources and using appropriate attenuation on the RF signal analyzer.

Presenter Bio:
David Hall is a Senior Product Marketing Manager for RF and Communications at National Instruments. David’s activities include building product demos, providing user feedback, and writing application notes. His particular subjects of expertise include digital signal processing and digital communications systems. Prior to joining the RF team, David helped develop example code and reference material for Baseband I/Q and IF generation and analysis as a product marketing engineer with the signal generators group. David holds a bachelor’s degree with honors in computer engineering from Penn State University.

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