David Vye, MWJ Editor
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David Vye is responsible for Microwave Journal's editorial content, article review and special industry reporting. Prior to joining the Journal, Mr. Vye was a product-marketing manager with Ansoft Corporation, responsible for high frequency circuit/system design tools and technical marketing communications. He previously worked for Raytheon Research Division and Advanced Device Center as a Sr. Design Engineer, responsible for PHEMT, HBT and MESFET characterization and modeling as well as MMIC design and test. David also worked at M/A-COM's Advanced Semiconductor Operations developing automated test systems and active device modeling methods for GaAs FETs. He is a 1984 graduate of the University of Massachusetts at Dartmouth, with a concentration in microwave engineering.

My Dinner with Carl

October 27, 2008

David Vye

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MWJ Publisher Carl Sheffres goes international
at the NYC Pizza Parlor in Amsterdam

All in all, its nice to see the sun today (between sessions) after a dismal, rainy Sunday in Amsterdam. Sightseeing was a rather damp experience for us Microwave Journal staffers who braved the wet weather and severe jet-lag in order to sample the local culture and cuisine. Yes, we went to the Van Gogh and Rijk Museums as well as the Melkweg, but it was the Irish bars that provided the comforting stew and suds.

It is now a busy Monday morning as European Microwave Week 2008 delegates register for the conferences and workers assemble the exhibition space. By 8:30 when the first sessions of the day began most attendees were already in one of the many sessions in progress. The day started with a healthy mix of microwave and millimeter-wave MMIC (GaAs) and Silicon IC talks from EuMIC and wireless transceiver presentations from EuWiT.

The EuMIC Plenary Opening got underway just before 11:00 during which four seperate EuWiT sessions took place. Meanwhile, three all day measurement-based sessions (EuMC and EuMC/EuMIC) were held on power amplifier modeling and linearization; advances in modeling low and high power devices; and determining/dealing with errors in Mw measurements. The EuWiT plenary is scheduled for the afternoon while a number of EuMIC sessions will take place.