ARTICLES

Fast and Accurate High Power Device Characterization with a Microstrip SOL Method

High power device characterizations, performed with a microstrip short-open-load (SOL) calibration kit, are presented. This article demonstrates an interesting alternative to the classical through-reflect-line (TRL) method, when only terminating impeda...
Precise device characterization is the starting point of any good circuit design. This task can be particularly challenging when the device is a high power transistor having low input and output impedances. For devices working only under pulse conditions, specific test benches exist 1 but are rather complicated and...
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