Pierre Bertram, Thales Air Defense

Fast and Accurate High Power Device Characterization with a Microstrip SOL Method

High power device characterizations, performed with a microstrip short-open-load (SOL) calibration kit, are presented. This article demonstrates an interesting alternative to the classical through-reflect-line (TRL) method, when only terminating impeda...

May 1, 2003

0 Comments

Precise device characterization is the starting point of any good circuit design. This task can be particularly challenging when the device is a high power transistor having low input and output impedances. For devices working only under pulse conditions, specific test benches exist 1 but are rather complicated and...

ARTICLES