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ARTICLES

Measurement of Modulated Scattering Parameters using Modulated Vector Network Analysis

Am introduction to the modulated vector analyzer(MVNA), a new instrument for RF and microwave measurement
Application Note Measurement of Modulated Scattering Parameters using Modulated Vector Network Analysis Don Metzger Modulation Instruments Division Credence Systems Corporation Colorado Springs, CO A new architecture for RF and microwave measurement has recently been introduced. The first instrument based on this architecture is called the modulated vector network analyzer...
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