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Articles by Agilent Technologies
Agilent Technologies Inc. announced it will demonstrate its latest PXI Functional Test System, plus boundary scan and latest inline in-circuit test systems, at NEPCON EMT China 2014 (Booth 1G60), April 23-25, at the Shanghai World Expo Exhibition & Convention Center.
Agilent and FIME announce availability of mobile payment test systems based on EMV contactless level 1 specifications
Agilent Technologies Inc. and FIME, a secure-chip consulting and testing provider, announced the availability of test systems based on the EMV® Contactless Level 1 Specification for mobile payments.
Agilent Technologies announced the recent installation of an Agilent 5600LS atomic force microscope with scanning microwave microscopy at the Cambridge Graphene Centre (CGC), in the UK.
UMShas announced the availability of greatly enhanced Process Design Kits leveraging the latest product innovations in Agilent’s ADS electronic design automation software.
The Agilent video “Verify and Visualize your TD-LTE Beamforming Signals” demonstratesthe Agilent N7100 Multi-Channel Signal Analyzer, 89600 VSA Software TD-LTE Beamforming MIMO 8-channel measurement solution.
The application brief, “Using Time Sidelobe Measurements to Assess the Performance of Compressed-Pulse Radars” defines key problems related to measurements of compressed-pulse radars, describes the time sidelobe method, and outlines the practical uses of this approach.
Agilent Technologies Inc. announced its participation, with ETS-Lindgren, in an educational panel discussion – “MIMO OTA Measurements: The Next Generation Platform for Wireless Testing” – at the International CTIA Wireless event in New Orleans.
Agilent Technologies Inc. announced the availability of a wideband MIMO PXI vector signal analyzer that delivers the industry’s highest-bandwidth signal analysis. The new analyzer enables R&D and test engineers to validate their MIMO 802.11ac designs with a unique combination of accuracy, speed, bandwidth and scalability in a small form factor.