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ARTICLES

Macro File and Design Window Compression Load Measurements

Measurement and evaluation algorithims that allow full load pull tests to be performed while driving transistors automatically into desired gain compression and measuring a selection of parameters as a function of input power
Christos Tsironis, Apostolos Samelis and Klaus Buehring
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Macro File and Design Window Compression Load Pull Measurements This article describes measurement and evaluation algorithms that allow full load pull tests to be performed while driving transistors automatically into desired gain compression and measuring a selection of parameters, such as output power, gain, efficiency, intermodulation, adjacent-channel power (ACP),...
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