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Articles by Mary Anne Tupta, Keithley Instruments

Increasing RF Device Test Throughput with Better Instrument Coordination

Knowledgeable use of the programmability of today’s multi-function instruments can go a long way toward reducing test costs and improving manufacturing productivity.
Mary Anne Tupta, Keithley Instruments
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Testing speed is important for all electronic components, but it is vital for low price two- and three-terminal devices such as diodes and transistors. Before RF tests can be conducted, the devices must be tested for DC operation. For diodes, that includes forward voltage, reverse breakdown voltage and leakage...
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