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Keysight, in collaboration with National Physical Laboratory (NPL) and the University of Surrey, has made the first 6G connection at speeds greater than 100 Gbps over sub-THz frequencies in the U.K.
Keysight has released Defying Gravity, a new space technology survey revealing that three in four decision makers consider software test automation as one of the top technical challenges impacting the satellite industry.
Keysight Technologies, Inc. is expanding its Novus portfolio with the new Novus mini, a network test platform in a compact form factor that addresses the needs of network engineers as they deploy automotive and industrial IoT devices.
To assist European-based mobile operators and network equipment manufacturers with verifying the interoperability and performance of their Open RAN solutions, Keysight is launching its first complete Open RAN testing laboratory for Europe at the company's Milan office in Italy.
Keysight Technologies, Inc. has enabled ArrayComm to obtain the first O-RAN ALLIANCE Fronthaul Certificate of Conformance for its O-DU with the Keysight Open RAN Architect (KORA) solutions.
Keysight Technologies, Inc. introduces the Keysight E36731A Battery Emulator and Profiler, a complete emulation solution that identifies the impact of variables affecting the battery drain of IoT devices.
Keysight Technologies, Inc. introduces the Keysight Digital Learning Suite, a new unified digital learning platform that provides university engineering educators and students with lab tools, resources and courseware through a single, secure web interface.
Keysight announced a real-time spectrum analysis (RTSA) solution enabling up to 2 GHz RTSA bandwidth for use with the Keysight N9042B UXA Signal Analyzer to monitor satellite signals and interference.
At the 2023 5G Challenge, Keysight's KORA solutions will be used in the CableLabs 5G Lab to test edge-to-core O-RAN subcomponents, verifying interoperability and measuring performance.
Keysight Technologies, Inc. introduces the new Iterative Learning Control (ILC) test method that significantly shortens digital pre-distortion (DPD) test times for power amplifiers (PAs).
