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Articles by National Instruments (NI)

NI drives down cost of wireless production test

NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, released the Wireless Test System (WTS), a solution that dramatically lowers the cost of high-volume wireless manufacturing test. Although faced with the rising complexity of wireless test, companies can confidently reduce test costs and multiply throughput on the production floor with a system optimized for measurement speed and parallel test.


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NI AWR Design Environment software featured at NIWeek 2015

 NI (formerly AWR Corporation) announces that NI AWR Design Environment™ will be on display within the Academic Forum, 5G/RF Pavilion and two technical sessions - High-Efficiency PAs for High PAR Signals Using an NI-Based Platform and Improving the Semiconductor Design-to-Test Flow Panel - during NIWeek 2015, August 3-5 in Austin, Texas.  


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NI AWR Design Environment supports Design Workshop Technologies DRC and LVS tools

NI (formerly AWR Corp.) announces AWR Connected™ for DWT, a new NI AWR Design Environment™ flow that enables integration with Design Workshop Technologies’ (DWT) design-rule checking (DRC) and/or layout vs. schematic (LVS) tools for printed circuit board (PCB) and module design.  The new AWR Connected for DWT DRC and LVS flow can run in one of two ways: in the full view/DWT user-interface (UI) mode or transparently from within the Microwave Office UI. 


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