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Recent developments in measurement and modeling technology have focused on technology-independent, measurement-based black box models. This white paper examines the different nonlinear models and measurement systems available today and how they can be used with Microwave Office®, a leading high-frequency design environment from AWR Corporation.
RF SiP and MCMs integrate CMOS integrated circuits (ICs) for digital circuits and GaAs or SiGe devices for RF and microwave circuits with soft-board laminates and LTCC packages. Software used to design these complex circuits must seamlessly bring together synthesis, simulation, and verification solutions via a single interface ensure optimum component design and placement in each technology.
