Articles by David Vye - Editor, Microwave Journal
June 14, 2012
Highlights the upcoming EDI CON 2013 conference and trade show that will take place in Beijing in 2013
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May 15, 2012
Explores the history of Nortel and the microwave companies it created
May 15, 2012
Overview of Microwave Journal’s coverage of the 2012 IEEE MTT-S International Microwave Symposium and Exhibition
May 15, 2012
Introducing the Journal’s newest venture with the launch of a new conference and trade show focused on high frequency/high speed electronic design in China
The CTIA Wireless 2012 MIMO OTA Expert Panels
April 6, 2012
Extensive efforts are underway to standardize on a next generation platform for performance testing of wireless devices, taking into account LTE, A-GPS, uncertainty budgets and use of head/hand phantoms. This Forum provides an understanding of system performance and presents the core elements - such as the chamber, software and instrumentation - that facilitate systematic and repeatable measurements of MIMO devices. A panel discussion with the speakers from ETS-Lindgren, Agilent Technologies, Spirent, and Elektrobit concludes the Forum.
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The CTIA Wireless 2012 MIMO OTA Expert Panels
March 27, 2012
Protocols used by LTE networks to leverage MIMO technologies are significantly impacted by correlation and thus by the channel models under which they’re tested. This Forum provides an understanding of over-the-air, multipath signal challenges, the impact on network performance and considerations for end-to-end testing. A panel discussion with speakers from Anritsu, Rhode &Schwarz, Azimuth and more to be announced will conclude the Forum.
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March 14, 2012
Eric Starkloff, Vice President of Marketing for Test and Embedded at National Instruments, talks about the company's development of new RF/microwave products and its push into the RF design realm via AWR's Microwave Office.
March 3, 2012
One can track the state of next generation microwave technology by following the developments of test & measurement equipment, RF/Microwave Semiconductors and the exhibitor announcements at the International Microwave Symposium. Coincidentally (or not), these are exactly the topics we are covering in the March through June issues. Since March is already in the can, here’s a look at our editorial plans in the remaining months of spring.
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Executive Interview:
January 14, 2012
Greg Peloquin, President of Richardson RFPD talks about his company's position as a major distributor of RF/microwave components and shifts in the global supply chain and related design centers.
Nonlinear: "Of or relating to a device whose behavior is described by a set of nonlinear equations and whose output is not proportional to its input." -The American Heritage® Dictionary of the English Language, Fourth Edition
March 12, 2010
S-parameters have been used to represent linear networks for simulation and design since the 1960s. Measuring S-parameters was made possible with the introduction of the network analyzer. Designers could then integrate S-parameter "black-boxes" along with other electrical components using linear frequency-domain simulators. The measure, model and simulate triumvirate has...
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