Articles by David Vye, Microwave Journal Editor

It’s back! For the first time since the 2003 event in Philadelphia, Microwave Week—featuring the International Microwave Symposium (IMS), the RFIC Symposium and the ARFTG Conference—returns to a city east of the Mississippi. That’s right, the largest show dedicated solely to our industry will be held in Atlanta: home...

The past 50 years has witnessed a remarkable evolution in semiconductor technology. The devices that enable our wireless communication systems rely on sophisticated characterization. “Measuring the Q of a Parametric Diode” by Richard Harrison, the May 1960 Microwave Journal article reprinted in this month’s “Then & Now” Cover Feature...

Welcome to March, another special month in our 50-year celebration of Microwave Journal and the microwave industry. This is the month we publish our annual Test & Measurement/CAD issue along with our Cables and Connectors supplement. As in previous years, we dedicate this month to measurement and simulation, two...

With the Microwave Journal November supplement “WiMAX and Emerging Technologies” hitting the streets and the WiMAX World and European Microwave Week (EuMW) conferences still fresh in the minds of those who attended, now seems like a great time to consider the impact these utopian “wireless everywhere” systems will have...

Browse through the articles and advertisements in any issue of Microwave Journal (MWJ) and you get a pretty good glimpse of the ecosystem that forms our industry. The component manufacturers (active and passive), the integrated circuit developers, the foundries that produce these MMICs and RFICs, the test and measurement...

As the majority of baby boomers approach 50, perhaps it’s time to re-label the term “mid-life crisis.” The “crisis” in turning 50 often refers to the looming realization that our existence is finite and the time has come to second-guess some of our choices. However, this generation in particular...