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Articles by Agilent Technologies Inc., Santa Clara, CA

Agilent's 3-D EM Simulation Platform Provides Accurate Modeling of RF Components

February 18, 2011
Agilent Technologies Inc. announced Electromagnetic Professional 2011.02, a new release of its 3-D electromagnetic modeling and simulation platform for creating 3-D models and analyzing the electrical performance of packages, connectors, antennas and other RF components. Known as EMPro, the platform is tightly integrated with Agilent’s Advanced Design System for...
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Agilent Signs Licensing Agreement with Qualcomm

February 18, 2011
Agilent Technologies Inc. announced that it has entered into a licensing agreement with Qualcomm Inc. for factory test technology. Under the terms of the agreement, Qualcomm granted Agilent a worldwide license to demonstrate and distribute products that leverage the Qualcomm technology for RF factory testing. The agreement makes Agilent...
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Agilent Announces LTE Wireless Communications Test Set for Manufacturing

February 17, 2011
Agilent Technologies Inc. announced the Agilent EXT wireless communications test set for wireless device manufacturing. The new Agilent EXT includes X-Series Measurement Applications and Sequence Studio software along with enhanced Signal Studio software to support the required testing of existing and emerging communication technologies such as LTE. The EXT...
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Agilent Introduces LTE Design Verification and Conformance Systems

February 16, 2011
Agilent Technologies Inc. announced its new design verification and conformance systems for LTE. The three systems extend Agilent’s GS-8800 series for cellular design verification and conformance and are intended for engineers testing LTE devices to meet the TS 36.521-1 standard. All three use the Agilent E6621A PXT wireless communications...
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Agilent InfiniiVision X-Series Oscilloscopes Offer Breakthrough Technology

February 15, 2011
Agilent Technologies has expanded its mixed-signal and digital-storage oscilloscope portfolio with 26 new models that comprise its next-generation InfiniiVision 2000 and 3000 X-Series. The new scopes incorporate breakthrough technology that allows advanced capabilities to be included in affordable instruments. The InfiniiVision 2000 X-Series offers bandwidths from 70 to 200...
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Agilent to Demonstrate Design and Test Solutions for 3G/4G and LTE-Advanced

February 8, 2011
Agilent Technologies Inc. will demonstrate its leading-edge communications test and measurement solutions for 3GPP LTE-Advanced, LTE, W-CDMA, HSPA+, E-EDGE (EDGE Evolution), UMA/GAN, WiMAX™ and femtocells at the Mobile World Congress in Barcelona, Spain. “Agilent is committed to providing premier test solutions for the highly competitive mobile communications development lifecycle,”...
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Agilent Introduces LTE-Advanced Signal Generation and Analysis Solutions

February 7, 2011
Agilent Technologies Inc. extended its leadership in LTE test with the introduction of dedicated LTE-Advanced signal generation and signal analysis solutions. Both solutions will be showcased at the upcoming Mobile World Congress in Barcelona, Spain, February 14-17 (Hall 1, Stand A46). LTE-Advanced is an evolution of LTE. It is...
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RF Probes

January 17, 2011

N9020A_U100Agilent offers an innovative family of RF probes that are engineered for in-circuit test measurement that can be used with signal/spectrum analyzers, signal source analyzers and network analyzers. With operating frequency of up to 12 GHz, the RF probes provide flat frequency response and low noise floor.


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PXI Microwave Switches

January 17, 2011

M9155-6-7-100Agilent offers a new PXI hybrid switch module series that operates from a frequency range from DC to 26.5 GHz.   It is being used in applications such as Automatic Test Equipment (ATE), RF communications measurements where a rugged switching module is needed in high density switching systems.


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Power Splitters and Power Dividers (Combiners)

January 17, 2011

Powersplitt100Agilent power splitters and dividers provide minimal insertion loss and high port isolation for highly accurate transmission line fault testing, power combining, source leveling, ratio measurements, power splitting, and critical signal processing.


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