Articles by Agilent Technologies Inc.

Agilent Technologies Inc. announced a new video, "8x8 LTE MIMO Analysis - N7109A Signal Analyzer - 89600 VSA - SystemVue."  See how new 8x8 MIMO simulation and measurement capabilities help LTE basestation designers stay ahead of rapidly evolving LTE standards test requirements.

Agilent Technologies Inc. announced the expansion of its award-winning Infiniium 90000 X-Series oscilloscope family to include the world’s highest performance mixed-signal oscilloscope, or MSO. The expansion adds six new MSO models, as well as 13-GHz DSO and DSA models, to the X-Series.

Agilent Technologies Inc. announced support for the High-Definition Multimedia Interface (HDMI) and Mobile High-Definition Link (MHL) sink tests through its M8190A arbitrary waveform generator and enhanced N5990A test-automation software.

Agilent Technologies Inc. announced the Agilent U8480 Series, the world’s fastest USB thermocouple power sensors. Based on the same front-end design as the Agilent 8480 and N8480 Series power sensors, the new U8480 Series offers improved specifications, including a measurement speed of 400 readings per second, 10 times faster than the legacy series.

Agilent Technologies Inc. announced it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).

Agilent Technologies Inc. announced the opening of a new calibration and repair service center for electronic test instruments in Hanoi, Vietnam. The new Agilent Advantage Services facility will offer local calibration and repair services, adding to more than 50 service locations around the world.

Agilent introduced the industry's first LTE-Advanced 8x8 MIMO signal-generation and analysis solutions. The offerings complement Agilent's other industry-first solutions for the LTE-Advanced standard.

Agilent’s new application note describes how the 89600 VSA software’s multi-measurement capability facilitates testing wireless devices and systems handling multiple carriers and formats at the same time.

Agilent will demonstrate the following test solutions:

With IC-CAP 2013.01, Agilent introduces major improvements to its flagship product for high-frequency device modeling. One key improvement is turnkey extraction of the Angelov-GaN model, the industry standard compact device model for GaN semiconductor devices.