Ted Rappaport, founding director of NYU WIRELESS and a leading proponent of using the millimeter wave spectrum for wireless communications, discusses the FCC's recent rulemaking actions and technology developments that are paving the way to 5G.
Agilent Technologies Inc. introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price.
Agilent Technologies Inc. announced a new protocol testing solution for MIPITM Alliance Gear2 DigRf v4 RFICs. The Agilent M9252A DigRF host adapter allows developers to speed testing and analysis of RFICs used in cellular phones, tablets and other mobile devices.
Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing.
Agilent Technologies Inc. introduced the industry’s first software solution for decoding the Universal Flash Storage (UFS) protocol on oscilloscopes. The new protocol decoder provides design and validation engineers with a fast, easy way to validate and debug their UFS interfaces.
Agilent Technologies Inc. introduced compliance testing support for Energy-Efficient Ethernet (EEE) standards used in networking applications. Agilent’s solution for transmitter tests includes 10BASE-T, 100BASE-T and 1000BASE-T EEE test standards as described in the IEEE 802.3az-2010 specification.
Agilent Technologies Inc. announced the availability of real-time spectrum analysis (RTSA) for its PXA X-Series signal analyzers. Agilent's RTSA delivers unmatched probability of intercept (POI), analysis bandwidth, sensitivity, and frequency range-capabilities that make it the best way for system developers and signal analysts to see, capture and understand highly elusive signals.
What: Agilent’s complimentary A+ Seminar Series, given by its technical expert distributors, is designed to provide hands-on labs, working sessions, tips, techniques, best practices and skills development.
Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif.