EMC/EMI

Test equipment and EDA vendors to promote SI, high-speed and EMC/EMI design solutions at EDI CON 2014

CST, a leading EM simulation software vendor for high-speed and Signal Integrity analysis and Anritsu,  a leading provider of test instruments for SI and high-speed digital measurements, RF/microwave and wireless test solutions will be among the premier level EDI CON sponsors highlighting SI and high speed solutions in their submitted presentations to the technical conference, workshops and in-booth demos. Both will discuss the challenges of high speed interconnect characterization and the use of frequency based measurement/modeling approaches such as s-parameters in the time domain analyses favored by high-speed designer.  


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Compact broadband amplifier from Rohde & Schwarz expands frequency range for EMC testing up to 6 GHz

The R&S BBA150 broadband amplifier from Rohde & Schwarz is now also available with a frequency range from 2.5 GHz to 6.0 GHz. The new frequency range is an addition to the already existing range from 0.8 GHz to 3.0 GHz. Thanks to their state-of-the-art design, the amplifiers, which have been optimized for high frequencies, deliver high output power, and are still compact and lightweight.


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3D EMC/EMI Simulation of Automotive Multimedia Systems

A key challenge in automotive product design is the compliance to electromagnetic compatibility (EMC) and interference (EMI) requirements in a cost-driven project environment. Traditionally, EMC and EMI issues are solved in the EMC lab, often without getting a full understanding of the underlying effects. The adoption of 3D field...
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IEEE International Symposium on Electromagnetic Compatibility (EMC 2006)

August 14-18, 2006<br>Portland, OR
The IEEE International Symposium on EMC (EMC 2006) will be uniquely balanced, affording excellent resources for EMC, design and compliance engineers. The technical program will feature top quality papers, presented by recognized, industry-leading experts. Further, the EMC 2006 technical program will be on the cutting edge of EMC information,...
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