Spectracom, a business of the Orolia Group, announces it has extended its global service capability through a partnership with EZU Technologies. Joining Spectracom service centers in North America and Europe, EZU Technologies will support Spectracom users throughout the Asia-Pacific region from their facility in Hong Kong. Initially services will include equipment calibration and repair services.
The LTC3624 is a high efficiency, 17V input capable synchronous buck regulator from Linear Technology that delivers up to 2A of continuous output current to outputs as low as 0.6V. Synchronous rectification delivers efficiencies as high as 95% while Burst Mode® operation requires only 3.5µA of no load quiescent current.
Anritsu Co. establishes a new standard in broadband performance with the introduction of the VectorStar™ ME7838D broadband system that provides industry-best frequency coverage of 70 kHz to 145 GHz in a single sweep using a coaxial test port. The VectorStar ME7838D gives design engineers greater confidence when performing on-wafer device characterization at 70 GHz and beyond.
Agilent Technologies Inc. introduces an eight-channel version of its U5309A 8-bit single-slot PCIe®Gen2 digitizer with on-board processing, providing unprecedented channel density and minimum footprint at this level of performance.
Anite, a global leader in wireless equipment testing technology, announced that it is first to offer chipset and device manufacturers the ability to verify their 4x4 Downlink (DL) MIMO designs and products, accelerating the development of LTE and LTE-Advanced devices. The milestone was achieved in close collaboration with a leading device manufacturer using Anite’s Development Toolset - an easy to use solution for early stage testing..
Anritsu Co. introduces the VectorStar™ ME7838E vector network analyzer (VNA) broadband system that provides frequency coverage from 70 kHz to 110 GHz in a single connection. Incorporating all the benefits of the VectorStar ME7838 series broadband system, the ME7838E addresses the challenges associated with today's high-speed device characterization.