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Test and Measurement Channel

Agilent releases new software for X-Series signal analyzers

November 1, 2012

Agilent Technologies Inc. extended its leadership in 802.11ac WLAN test solutions with its latest measurement application release for X-Series signal analyzers.


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AR's new EMI receiver can reduce test time from days to minutes

TestBench
November 1, 2012

AR Receiver Systems has introduced a DSP-based emissions receiver that has the speed and accuracy to reduce test time from days to minutes.The new Model DER2018 Digital Emissions Receiver offers continuous coverage from 20 Hz to 18 GHz with 140 MHz instantaneous bandwidth.

 


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AWR Connected for Optenni Lab accelerates wireless antenna design

October 31, 2012

AWR Corp. and Optenni Ltd. announced AWR Connected for Optenni Lab, an integrated workflow that accelerates wireless antenna design by enabling optimized matching circuits to be transferred from Optenni Lab matching circuit software to AWR’s Microwave Office high-frequency design software with a single mouse click. The interface constructs the matching circuit in Microwave Office, sets up and runs the simulation, and then allows for further refinement and analysis within Microwave Office and AXIEM®, AWR’s 3D planar electromagnetic simulator.


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Compact R&S SGS100A vector signal generator supports up to 12.75 GHz

October 31, 2012

Rohde & Schwarz has enhanced its fully integrated R&S SGS100A by adding a model for I/Q modulated signals from 80 MHz to 12.75 GHz. Combined with an I/Q baseband generator, the instrument can be used to generate test signals for all radio standards in this frequency range. As a result, the R&S SGS100A is ideal for X-band signals from 8 GHz to 12 GHz for radar and satellite communications. The I/Q modulator's wide RF bandwidth of 1 GHz makes it possible to generate pulses with high chirp bandwidths and steep pulse edges.   


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R&S presents high-end R&S FSW43 signal and spectrum analyzer for the microwave range

October 30, 2012

Rohde & Schwarz now offers a new R&S FSW signal and spectrum analyzer that covers the frequency range from 2 Hz to 43.5 GHz. Its high RF dynamic range, measurement speed and numerous functions make the R&S FSW43 an excellent microwave analyzer. The displayed average noise level of –164 dBm with preamplifier switched on is very low in the microwave range. With a phase noise of –117 dBc (Hz) at 40 GHz and 10 kHz carrier offset, the analyzer allows high-sensitivity measurements even close to the carrier, e.g. on radar signals.


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Auriga Microwave launches 4th generation TR module test system with Auriga WIDE

October 30, 2012

Auriga Microwave, an international leader in designing and manufacturing innovative RF/microwave solutions, announced the release of their next generation TR module test system, CTS-4.


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Agilent and the University of Leeds open terahertz measurement research lab

October 30, 2012

Agilent Technologies Inc. announced the opening, at the University of Leeds, of the first Agilent-equipped terahertz measurement laboratory in Europe. The new laboratory will enable research on devices, components, circuits and systems at much higher frequencies than any other institution in the region has been able to do before.


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Agilent expands capabilities of handheld spectrum analyzers for enhanced in-field use

October 29, 2012

Agilent Technologies Inc. announced expanded capabilities for the N934x C family of rugged handheld spectrum analyzers. The additional features give the HSA enhanced versatility for in-field applications like instrument remote control and peak power measurement of pulsed signals.


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AWR introduces Analyst: 3D FEM EM simulation integrated within MWO

EDAFocus
October 29, 2012

AWR Corp. announces the commercial release and immediate availability of Analyst. Analyst is a full featured, 3D EM industry standard FEM simulator that is completely integrated into AWR’s Microwave Office circuit simulation environment.


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Practical test needs trump instrument silos

October 29, 2012

Justin PanzerWireless communications industry veteran Justin Panzer brings his insights to this edition of the Tek Talk blog. He has more than 19 years of industry experience, including 10 years in test and measurement working on everything from commercial handset testing to mil/gov RF. He is currently business development director for the Sources & Analyzers Product Line at Tektronix. He holds a Bachelor of Science from Drexel University and an MBA from Auburn University.

Ubiquity of wireless communications is adding an RF component to electronics designs that haven’t historically been wireless enabled. More complex chip, board and embedded systems designs that incorporate communications technologies into everything from PCs to automobiles are changing the impact of RF on the world's R&D engineers. Designers today need the tools to get the most out of unfamiliar technologies.


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