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Test and Measurement Channel

Agilent introduces TDR/TDT solution for accurately characterizing multiport 25/28/100-Gb/s designs

Agilent Technologies Inc. introduced the Agilent N1055A 35/50-GHz (8-ps) time-domain reflectometry and transmission module for the Agilent 86100D DCA-X platform. The module provides fast, accurate impedance and S-parameter measurements on high-speed designs that have up to 16 ports.


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NI Trend Watch 2014 highlights technological breakthroughs

National Instruments released NI Trend Watch 2014, which summarizes the latest technology trends to help engineers meet evolving demands and integrate the ever-increasing power of technology into their work. The inaugural report examines a range of topics — from cyber-physical systems to the “SDR-ification” of RF instruments.


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Technical and educational sessions addressing high-speed signal integrity challenges to be conducted by Anritsu at DesignCon 2014

Anritsu Co. (DesignCon booth #501), a world leader in high-speed signal integrity test solutions, will present a series of technical and educational sessions during DesignCon to help engineers solve the measurement challenges associated with designing high-speed semiconductors, and communications systems and devices. Additionally, technical demonstrations will be held in the Anritsu booth throughout DesignCon, which is scheduled for January 28-31 in the Santa Clara Convention Center, Santa Clara, CA.


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Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


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