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Test and Measurement Channel

Anritsu announces remote control capability for portable PIM test analyzer

Anritsu Co. introduces Windows-based remote control software for its PIM Master MW82119A, the industry’s first high-power, battery-operated, portable PIM test analyzer. With the software, field technicians on the ground can control an MW82119A configured on top of the tower, making it easier and more efficient to conduct highly accurate PIM measurements, especially for difficult-to-access sites, such as Remote Radio Head (RRH) installations.


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Agilent introduces wireless communications test set with integrated multiport adapter

Agilent Technologies Inc. introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price.


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Lake Shore CVT probes improve efficiency and accuracy of probe station measurement

Lake Shore announces a new continuously variable temperature (CVT) probe, developed in collaboration with TOYO Corp., that allows for true, continuous unattended wafer probing of a material sample across a range of temperatures. The probes, when used in any Lake Shore probe station, significantly improve reliability of sample measurement.


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R&S offers cost-efficient generation and analysis of WLAN IEEE 802.11ac signals up to 160 MHz

Rohde & Schwarz has tailored its mid-range measuring instruments to handle WLAN signals in line with IEEE 802.11ac. Using the R&S SMBV100A and R&S FSV, manufacturers of WLAN chipsets, components and devices can now easily generate and analyze signals with 160 MHz bandwidth.


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Aeroflex digital radio test set adds support for LTE-A carrier aggregation

Test & Measurement Channel

Aeroflex Ltd., a wholly owned subsidiary of Aeroflex Holding Corp. announced that the 7100 Digital Radio Test Set has added support for carrier aggregation, a key component of LTE-Advanced (LTE-A).


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SenarioTek introduces signal conditioning capability to FlexMatrix

Test & Measurement Channel

SenarioTek announced the extension of the FlexMatrix reconfigurable RF switch matrix series to incorporate external signal conditioning. Now test engineers can easily route their required signal conditioning into RF switching paths for applications such as radar, military communications and consumer wireless.


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Agilent announces host adapter for MIPI Alliance DigRF v4 RFICs

Agilent Technologies Inc. announced a new protocol testing solution for MIPITM Alliance Gear2 DigRf v4 RFICs. The Agilent M9252A DigRF host adapter allows developers to speed testing and analysis of RFICs used in cellular phones, tablets and other mobile devices.


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New IP for NI vector signal transceiver extends out-of-the-box capabilities

Software/EDA Channel

National Instruments announced 10 pieces of new application IP that enable engineers and scientists to use NI LabVIEW system design software to build their own custom RF instruments. This IP integrates with PXI FPGA targets such as the NI PXIe-5644R VST and extends their default capabilities.


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R&S and ASTRI demonstrate 2x2 MIMO test solution on LTE-Advanced small cells

Rohde & Schwarz performs together with ASTRI a live test on a 2x2 MIMO base station in the uplink and downlink at the Mobile World Congress 2013. Hong Kong Applied Science and Technology Research Institute (ASTRI) provides an LTE-Advanced small cell as the device under test. What makes this demonstration special is that the 2x2 MIMO signal is generated and analyzed using only a single measuring instrument each.    


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Agilent launches versatile benchtop boundary scan analyzer for electronic test

Boundary scan has become an indispensable technology as engineers face increasing test access challenges. The x1149 boundary scan analyzer is a versatile yet easy to use board test tool designed to help users through board design and validation, and re-using the same x1149 test in manufacturing.


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