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Test and Measurement Channel

NI Trend Watch 2014 highlights technological breakthroughs

National Instruments released NI Trend Watch 2014, which summarizes the latest technology trends to help engineers meet evolving demands and integrate the ever-increasing power of technology into their work. The inaugural report examines a range of topics — from cyber-physical systems to the “SDR-ification” of RF instruments.


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Agilent installs atomic force microscope at Cambridge Graphene Centre

Agilent Technologies announced the recent installation of an Agilent 5600LS atomic force microscope with scanning microwave microscopy at the Cambridge Graphene Centre (CGC), in the UK.


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Technical and educational sessions addressing high-speed signal integrity challenges to be conducted by Anritsu at DesignCon 2014

Anritsu Co. (DesignCon booth #501), a world leader in high-speed signal integrity test solutions, will present a series of technical and educational sessions during DesignCon to help engineers solve the measurement challenges associated with designing high-speed semiconductors, and communications systems and devices. Additionally, technical demonstrations will be held in the Anritsu booth throughout DesignCon, which is scheduled for January 28-31 in the Santa Clara Convention Center, Santa Clara, CA.


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Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


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AWT Global introduces new TETRA PIM Analyzer

AWT Global has launched a new PIM analyzer for TETRA and UHF frequencies: The S1L TETRA MK2 Series. The new PIM analyzers are designed for measuring TETRA and UHF networks in the 400 MHz frequency range.


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Rohde & Schwarz presents R&S FSW-B500 hardware option

Rohde & Schwarz has expanded the analysis bandwidth for its R&S FSW high-end signal and spectrum analyzers, claiming to be the first company to offer analysis bandwidth of 500 MHz.


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Chalmers University selects Anritsu ME7838A vector network analyzer

Chalmers University has selected Anrtisu’s ME7838A broadband mm-wave test system to provide measurements supporting the development of new, high-frequency devices and components.


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Tektronix acquires Picosecond Pulse Labs

Tektronix Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, announced the acquisition of Picosecond Pulse Labs. The move is intended to strengthen the Tektronix portfolio in the growing market for test equipment to support 100G/400G optical data communications research and development. The terms of the transaction were not disclosed.  


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Aeroflex announces contracts worth over $20M

Test & Measurement

Aeroflex Holding Corp., a leading global provider of high performance microelectronic components, and test and measurement equipment, announced the signing of two contracts in its Aeroflex Microelectronic Solutions business for over $20 million of high-performance, high-reliability mixed-signal semiconductors.


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AT4 wireless selects Anite’s SAS for LTE acceptance programmes

AT4 wireless has selected SAS, Anite’s interoperability and performance test solution, for advanced and rapid LTE device verification related to operator acceptance schemes.


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