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Test and Measurement Channel

R&S presents high-end R&S FSW43 signal and spectrum analyzer for the microwave range

Rohde & Schwarz now offers a new R&S FSW signal and spectrum analyzer that covers the frequency range from 2 Hz to 43.5 GHz. Its high RF dynamic range, measurement speed and numerous functions make the R&S FSW43 an excellent microwave analyzer. The displayed average noise level of –164 dBm with preamplifier switched on is very low in the microwave range. With a phase noise of –117 dBc (Hz) at 40 GHz and 10 kHz carrier offset, the analyzer allows high-sensitivity measurements even close to the carrier, e.g. on radar signals.


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Agilent and the University of Leeds open terahertz measurement research lab

Agilent Technologies Inc. announced the opening, at the University of Leeds, of the first Agilent-equipped terahertz measurement laboratory in Europe. The new laboratory will enable research on devices, components, circuits and systems at much higher frequencies than any other institution in the region has been able to do before.


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Practical test needs trump instrument silos

Justin PanzerWireless communications industry veteran Justin Panzer brings his insights to this edition of the Tek Talk blog. He has more than 19 years of industry experience, including 10 years in test and measurement working on everything from commercial handset testing to mil/gov RF. He is currently business development director for the Sources & Analyzers Product Line at Tektronix. He holds a Bachelor of Science from Drexel University and an MBA from Auburn University.

Ubiquity of wireless communications is adding an RF component to electronics designs that haven’t historically been wireless enabled. More complex chip, board and embedded systems designs that incorporate communications technologies into everything from PCs to automobiles are changing the impact of RF on the world's R&D engineers. Designers today need the tools to get the most out of unfamiliar technologies.


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