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Test and Measurement Channel

Agilent Technologies announces 4x4 true MIMO evolution on EXM wireless test set

Agilent Technologies
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Agilent Technologies Inc. announced that its EXM wireless test set now supports 4x4 True MIMO capability for WLAN design and validation, with up to four TRXs testing multiple-input, multiple-output antenna characteristics simultaneously. This capability further advances the gigabit era for WLAN evolution, especially the rapidly evolving 802.11ac technology.


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EMSCAN launches ERX+™

EMSCAN
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This high resolution EMC/EMI diagnostic system has been reinvented to assist high density board designers to visualize the root causes of potential EMC and EMI problems during pre- and post-EMC compliance testing.


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Agilent Technologies introduces impedance analyzers with flexible frequency options

Test & Measurement
Agilent Technologies
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Agilent Technologies Inc. introduced the Agilent  E4990A and  E4991B impedance analyzers, specifically designed for R&D, quality assurance and inspection engineers characterizing and evaluating passive electronic components, semiconductor devices and materials. The analyzers provide unparalleled accuracy and the best performance in the industry with flexible frequency options, all at an affordable price.


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Anritsu extends leadership position in protocol conformance test

Anritsu Company
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Anritsu Co. announced that the Global Certification Forum (GCF) recently confirmed at the CAG#38 meeting in Taipei that the Anritsu ME7834L Protocol Conformance Test (PCT) system has achieved the highest number of approved IMS test cases for device certification.


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Agilent Technologies introduces BGA interposer solution for probing DDR4 designs

Agilent Technologies
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Agilent Technologies Inc. introduced two new interposer solutions for testing DDR4 and DDR3 DRAM designs with a logic analyzer. Both interposer solutions provide fast, accurate capture of address, command and data signals for debugging designs and making validation measurements.


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Device Technology and VNA Architecture for Broadband Device Characterization

Steve Reyes Anritsu Co., Morgan Hill, CA
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Accel-RF Instruments Corporation announces its participation in the CS MANTECH Exhibition in Denver, CO

Accel-RF
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Accel-RF Instruments Corp. announces its participation in the upcoming CS MANTECH Exhibition in Denver, CO. The MANTECH conference will take place May 19 through 22 at the Downtown Denver Sheraton.


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National Instruments UK & Ireland hosts Automated Test Summit 2014

National Instruments, Austin, TX
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National Instruments UK & Irelandwill host industry experts and test professionals at the Automated Test Summit 2014 on 19th June at the Madejski Stadium, Reading, UK. The event will allow delegates to learn about the top trends and technologies influencing automated test through informative presentations, technical discussions and ten hours of hands-on training.


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Agilent Technologies' advanced design system software selected by GIT Japan

Agilent Technologies
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Agilent Technologies Inc. announced that GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected Agilent EEsof EDA’s Advanced Design System (ADS) electronic design automation platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.


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Auriga elevated to Agilent Global Solutions Partner

Auriga Microwave
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Auriga announced that Agilent Technologies Inc. has designated Auriga Microwave a Global Solutions Partner, Agilent's highest level status for their Solution Partner program.


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