Test and Measurement Channel

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Agilent Technologies Inc. announced the opening, at the University of Leeds, of the first Agilent-equipped terahertz measurement laboratory in Europe. The new laboratory will enable research on devices, components, circuits and systems at much higher frequencies than any other institution in the region has been able to do before.

Agilent Technologies Inc. announced expanded capabilities for the N934x C family of rugged handheld spectrum analyzers. The additional features give the HSA enhanced versatility for in-field applications like instrument remote control and peak power measurement of pulsed signals.

AWR Corp. announces the commercial release and immediate availability of Analyst. Analyst is a full featured, 3D EM industry standard FEM simulator that is completely integrated into AWR’s Microwave Office circuit simulation environment.

Wireless communications industry veteran Justin Panzer brings his insights to this edition of the Tek Talk blog. He has more than 19 years of industry experience, including 10 years in test and measurement working on everything from commercial handset testing to mil/gov RF. He is currently business development director for the Sources & Analyzers Product Line at Tektronix. He holds a Bachelor of Science from Drexel University and an MBA from Auburn University.

Ubiquity of wireless communications is adding an RF component to electronics designs that haven’t historically been wireless enabled. More complex chip, board and embedded systems designs that incorporate communications technologies into everything from PCs to automobiles are changing the impact of RF on the world's R&D engineers. Designers today need the tools to get the most out of unfamiliar technologies.

What: This application note addresses test challenges faced by phased array antenna engineers including:

• The need for fast wideband, high resolution sampling of IF signals post downconversion.

AMCAD Engineering announced the upgrade of its PIV semiconductor device analyzer family for the next generation of High Voltage Fast Switching (HVFS) Transistors.

Agilent Technologies Inc. announced the webcast, “Calibration: Why It Matters and What It Should Include,” hosted by Bob Stern, senior metrologist and Agilent Electronic Measurement Group representative to NCSLI. The webcast will be held Nov. 8.

Teledyne LeCroy introduces two series of HD oscilloscopes with HD4096 high definition technology, the HDO4000 and HDO6000. Oscilloscopes with HD4096 acquire waveforms with high resolution, high sample rate, and low noise. 

Agilent Technologies Inc. announced that EMPro 2012 will be demonstrated at European Microwave Week (Booth 114), Oct. 29-Nov. 1, RAI, Amsterdam.

Anritsu Co. introduces a series of enhancements, including a new APCO P25 Phase 2 (TDMA) signal analyzer and improved NBFM testing capability, for its LMR Master S412E.