Teledyne LeCroy announces automated physical layer transmitter compliance test capability for the MIPI M-PHY standard. The new compliance test software, QPHY-MIPI-MPHY, enables the highest level of confidence in M-PHY compliance by measuring a large number of cycles in a short period of time.
Rohde & Schwarz will collaborate with Communications Components Inc. to provide operators and test services providers with a comprehensive solution for base station installation and maintenance including PIM testing.
Anite announced it will be expanding its device application testing capability by entering into an agreement to acquire the trade and assets of Setcom Wireless Products GmbH, a supplier of wireless device application test solutions,based in Munich, Germany.
PCTEST Engineering Laboratory Inc. (PCTEST LAB), an accredited testing laboratory for wireless testing and certification, has upgraded its R&S TS8980FTA-2 and R&S CMW500 systems to accommodate the new 4G/LTE test plans for industry conformance and carrier acceptance testing.
Anritsu Co. introduces the ShockLine™ MS46121A series of 1-port USB Vector Network Analyzers (VNAs) that bring the price, performance, and ease-of-use advantages of Anritsu’s patented ShockLine VNA technology to an extremely compact package.
Tektronix introduced the TSG4100A, a vector signal generator (VSG) at the affordable price of a basic signal generator. The new RF signal generator complements other leading mid-range RF test solutions from Tektronix, such as the USB-based RSA306 spectrum analyzer, and mixed domain oscilloscopes.
Keysight Technologies Inc. announced new capabilities for the EXM wireless test set.The capabilities were added to address the latest technology evolutions in wireless communications with support for WLAN 802.11p, 802.11ah, 802.11ac Wave 2 Measurements, and Bluetooth® 4.2. The EXM now can make the measurements required to efficiently manufacture today’s and tomorrow’s Internet-of-Things wireless devices.
Keysight Technologies Inc. announced that its E6650A EXF wireless test set for femtocell now supports high-volume manufacturing test for designs using Broadcom Corp.’s BCM617xx series small cell chipsets. The EXF one-box tester delivers the speed, performance and scalability today’s manufacturers need to quickly ramp up production and lower its cost-of-test.