- Buyers Guide
Test and Measurement Channel
Manufacturers and test houses can now use the R&S VTC and R&S VTE video testers from Rohde & Schwarz to test next-generation HDMI sink devices with ultra-HD or 4k screen resolution. This is possible thanks to the new R&S VT-B360 HDMI TX 300 MHz HDMI module, which is equipped with four parallel HDMI channels with ultra-HD resolution. Tests can be performed on TVs, monitors, projectors and A/V receivers with conventional screen resolutions as well.
Analog Devices Inc. (ADI) introduced a wireless vibration sensing system that allows industrial systems operators to remotely monitor production equipment health, improve system performance, and reduce maintenance costs. The new networked system includes the ADIS16229 iSensor(R) wireless vibration sensor node, which combines dual-axis digital MEMs (micro-electro mechanical systems) acceleration sensing with advanced frequency-domain and time-domain signal processing.
More dynamic range and measurement speed in the microwave range: The new R&S ZNB20 and R&S ZNB40 network analyzers now offer these features in the midrange price segment as well. Like all models in the R&S ZNB family, their compact hardware platform requires less space than similar instruments. The advanced 16:9 format touchscreen makes operation easy.
A new measurement option from Rohde & Schwarz for the R&S FSW high-end signal and spectrum analyzer supports realtime signal analysis for frequencies up to 50 GHz with an analysis bandwidth of 160 MHz.
Vaunix Technology Corp., (www.vaunix.com), a manufacturer of USB controlled and powered test equipment, is pleased to announce they’ll be displaying their latest models of USB powered Lab Bricks at the International Microwave Symposium (IMS) in Seattle, WA June 4-6th in booth #2042.
Anritsu Co. (booth #938) will display test solutions to meet the high-frequency testing requirements of engineers in the aerospace and defense, communications, and semiconductor industries at IMS 2013 in Seattle, June 4-6. Featured will be the VectorStar Vector Network Analyzer (VNA) platform, which is an ideal solution for device characterization, as well as solutions for measuring components and subsystems used in radar, high-speed serial, microwave backhaul, wireless network, and other applications.
Mesuro has launched a new test solution that utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments.
Rohde & Schwarzand 7Layers have verified and validated the Synchronized test approach to determine the Envelope Correlation Coefficient, which characterizes the antenna subsystem of MIMO LTE devices.
MiCOM Labs Inc., has released MiTest, a hardware and cloud based computing test system that can accelerate product development release by running regulatory compliance testing in a company’s own design lab. “MiTest provides manufacturers the ability to consolidate company-wide test processes, enabling flexible in-house compliance testing and certification possibilities for new products,” said Gordon Hurst, president and CEO for MiCOM Labs.
Auriga Microwave and Focus Microwaves, RF microwave industry market leaders, integrated their showcase systems, Auriga's AU4850 Pulsed IV/RF Characterization System and Focus' Harmonic Load-pull System to provide users unmatched measurement capabilities. Responding to market demands, Auriga and Focus have developed a software bridge to provide users harmonic pulsed load-pull measurement capability. The software will be offered by both companies through their respective sales channels.