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Test and Measurement Channel

Agilent announces ENA Series network analyzer that reduces cost, optimizes test of RF components

Agilent Technologies Inc. announced theE5063A ENA Series network analyzer, a low-cost ENA solution for manufacturing test. The instrument offers optimized performance and functionality for testing simple RF passive components, such as handset/BTS antennas, RF cables and filters. It can also be used in R&D for evaluation of RF passive devices and dielectric materials.


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Anritsu demonstrates LTE-A Category 6 peak data rates of 300 Mbps

Anritsu has worked with Qualcomm Technologies Inc. to successfully demonstrate peak throughput for a Category 6 LTE device and network simulator using 20+20 MHz Carrier Aggregation.


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Anritsu introduces world’s first 40 GHz handheld cable and antenna analyzer

Test & Measurement

Anritsu Co. introduces the Microwave Site Master S820E, the world’s first handheld cable and antenna analyzer with frequency coverage up to 40 GHz, which continues Anritsu’s leadership position in the handheld analyzer market it established with the first broadband Site Master over 15 years ago.


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Agilent introduces TDR/TDT solution for accurately characterizing multiport 25/28/100-Gb/s designs

Agilent Technologies Inc. introduced the Agilent N1055A 35/50-GHz (8-ps) time-domain reflectometry and transmission module for the Agilent 86100D DCA-X platform. The module provides fast, accurate impedance and S-parameter measurements on high-speed designs that have up to 16 ports.


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NI Trend Watch 2014 highlights technological breakthroughs

National Instruments released NI Trend Watch 2014, which summarizes the latest technology trends to help engineers meet evolving demands and integrate the ever-increasing power of technology into their work. The inaugural report examines a range of topics — from cyber-physical systems to the “SDR-ification” of RF instruments.


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Agilent installs atomic force microscope at Cambridge Graphene Centre

Agilent Technologies announced the recent installation of an Agilent 5600LS atomic force microscope with scanning microwave microscopy at the Cambridge Graphene Centre (CGC), in the UK.


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Technical and educational sessions addressing high-speed signal integrity challenges to be conducted by Anritsu at DesignCon 2014

Anritsu Co. (DesignCon booth #501), a world leader in high-speed signal integrity test solutions, will present a series of technical and educational sessions during DesignCon to help engineers solve the measurement challenges associated with designing high-speed semiconductors, and communications systems and devices. Additionally, technical demonstrations will be held in the Anritsu booth throughout DesignCon, which is scheduled for January 28-31 in the Santa Clara Convention Center, Santa Clara, CA.


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Agilent introduces series of BER test solutions for faster design verification

Test & Measurement

M8000seriesAgilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.


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AWT Global introduces new TETRA PIM Analyzer

AWT Global has launched a new PIM analyzer for TETRA and UHF frequencies: The S1L TETRA MK2 Series. The new PIM analyzers are designed for measuring TETRA and UHF networks in the 400 MHz frequency range.


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Rohde & Schwarz presents R&S FSW-B500 hardware option

Rohde & Schwarz has expanded the analysis bandwidth for its R&S FSW high-end signal and spectrum analyzers, claiming to be the first company to offer analysis bandwidth of 500 MHz.


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