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Test and Measurement Channel

Anritsu Co. extends frequency coverage of ShockLine VNA families to 43.5 GHz

Anritsu Co. announces that it has extended the frequency coverage of its MS46322A Series ShockLine™ Economy Vector Network Analyzers (VNAs) and MS46122A Series ShockLine Compact VNAs to 43.5 GHz. By supporting the higher frequency, the low-cost VNAs can efficiently conduct S-parameter and time domain measurements on RF and microwave passive devices up to 43.5 GHzin a variety of cost-sensitive engineering, manufacturing and university testing applications.


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MI Technologies receives A2LA accreditation

MI Technologies is proud to announce its Test Services Laboratory has been accredited in accordance with the recognized International Standard ISO/IEC 17025:2005 General Requirements for the Competence of Testing and Calibration Laboratories by the American Association for Laboratory Accreditation (A2LA).


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Anritsu solution reduces cost of field testing

Anritsu Co. introduces a CPRI RF Measurement option for its BTS Master™ handheld base station analyzer family that can significantly reduce the operational expense (OpEx) associated with troubleshooting interference at base stations. Featuring best-in-class sweep speed and unique test capabilities, the BTS Master-based CPRI RF measurement test set allows field engineers and technicians to conduct accurate RF measurements on Remote Radio Heads (RRHs) while remaining at ground level, eliminating the considerable expense and time associated with calling a tower crew to conduct interference measurements.


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Tektronix expands DPO70000SX ATI high performance oscilloscope family

Tektronix Inc., the world's leading manufacturer of oscilloscopes, announced the expansion of its DPO70000SX Performance Oscilloscope Seriesto include 50 GHz and 23 GHz models. By extending our flagship 70 GHz model, the new 50 GHz product is ideal for engineers and researchers who want to take advantage of the superior low-noise performance of the patented asynchronous time interleaving (ATI) architecture for technologies such as 28 GBaud PAM4 and Kband frequency testing. The 23 GHz instrument joins the existing 33GHz models which feature compact dimensions and built-in scalability using the UltraSync synchronization technology.


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Accel-RF announces Quantum SMART bench-top semiconductor test system

Accel-RF Instruments Corp., the worldwide leader in turn-key reliability and performance characterization test systems for compound semiconductors, has “unplugged” the industry-leading RF SMART Fixture from their automated test platform and made it available for bench-top testing. “Quantum-SMART” enables concurrent testing for reliability validation, performance-characterization, and product qualification through RF-biased burn-in and product functional testing.


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